| Presentation | 2014-02-28 Investigation of Feedback-Controlled Electromigration Using FPGA System Yuma KANAMARU, Masazumi ANDO, Takanari SAITO, Jun-ichi SHIRAKASHI, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Electromigration method for the fabrication of nanogaps is specifically simple as compared with other methods because it is achieved by only passing a current through a metal nanowire. However, typical electromigration procedure induces an abrupt break that yields a nanogap with high tunnel resistance. Hence, various approaches have been reported to address this problem, and feedback-controlled electromigration (FCE) scheme has been successfully employed to make nanogaps safely and reliably. On the other hand, the formation of nanogaps by FCE method using processor-based control system is generally slow process. In this study, we designed a fully customized hardware system using field programmable gate array (FPGA). An FPGA is a device that contains a matrix of reconfiguration gate array logic circuitry. Furthermore, we applied this system to Au μm-wires. When an FPGA is configured, the internal circuitry is connected in a way that creates a hardware implemention of FCE process. Unlike processors, FPGAs use dedicated hardwares for processing logic. Therefore, FPGA-based control systems can perform deterministic closed loop control at extremely fast loop rates. In this report, FCE procedure was applied to the Au μm-wires at room temperature using FPGA-based control system. Consequently, conductance G was precisely controlled from 10mS to less than 1mS for within 1 sec, which is 10^<2-3> times shorter than that of FCE process using processor-based control system. The results imply that FCE procedure using FPGA-based control system can precisely tune the channel resistance of metal nanowires. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | electromigration / nanogap / field programmable gate array |
| Paper # | ED2013-147,SDM2013-162 |
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| Conference Information | |
| Committee | SDM |
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| Conference Date | 2014/2/20(1days) |
| Place (in Japanese) | (See Japanese page) |
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| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Silicon Device and Materials (SDM) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Investigation of Feedback-Controlled Electromigration Using FPGA System |
| Sub Title (in English) | |
| Keyword(1) | electromigration |
| Keyword(2) | nanogap |
| Keyword(3) | field programmable gate array |
| 1st Author's Name | Yuma KANAMARU |
| 1st Author's Affiliation | Department of Electrical and Electronic Engineering, Tokyo University of Agriculture and Technology() |
| 2nd Author's Name | Masazumi ANDO |
| 2nd Author's Affiliation | Department of Electrical and Electronic Engineering, Tokyo University of Agriculture and Technology |
| 3rd Author's Name | Takanari SAITO |
| 3rd Author's Affiliation | Department of Electrical and Electronic Engineering, Tokyo University of Agriculture and Technology |
| 4th Author's Name | Jun-ichi SHIRAKASHI |
| 4th Author's Affiliation | Department of Electrical and Electronic Engineering, Tokyo University of Agriculture and Technology |
| Date | 2014-02-28 |
| Paper # | ED2013-147,SDM2013-162 |
| Volume (vol) | vol.113 |
| Number (no) | 450 |
| Page | pp.pp.- |
| #Pages | 5 |
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