| Presentation | 2014-02-10 A Low Power Consumption Oriented Test Generation Method for Transition Faults Using Multi Cycle Capture Test Generation Hiroshi YAMAZAKI, Yuto KAWATSURE, Jun NISHIMAKI, Atsushi HIRAI, Toshinori HOSOKAWA, Masayoshi YOSHIMURA, Koji YAMAZAKI, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | High power dissipation can occur when the response to a test pattern is captured by flip-flops in at-speed scan testing, resulting in excessive IR drop, which may cause significant capture-induced yield loss in the deep submicron era. Therefore, it is an important problem to reduce capture power dissipation. It was reported that a multi-cycle BIST scheme could reduce capture power dissipation. In this paper, we propose a test generation for broad side scan testing using multi-cycle capture test generation to reduce capture power dissipation by paying our attention to this point. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | transition faults / low power dissipation / multi-cycle capture test generation / untestable faults |
| Paper # | DC2013-89 |
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| Committee | DC |
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| Conference Date | 2014/2/3(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Low Power Consumption Oriented Test Generation Method for Transition Faults Using Multi Cycle Capture Test Generation |
| Sub Title (in English) | |
| Keyword(1) | transition faults |
| Keyword(2) | low power dissipation |
| Keyword(3) | multi-cycle capture test generation |
| Keyword(4) | untestable faults |
| 1st Author's Name | Hiroshi YAMAZAKI |
| 1st Author's Affiliation | Graduate School of Industrial Technology, Nihon University() |
| 2nd Author's Name | Yuto KAWATSURE |
| 2nd Author's Affiliation | Graduate School of Industrial Technology, Nihon University |
| 3rd Author's Name | Jun NISHIMAKI |
| 3rd Author's Affiliation | Graduate School of Industrial Technology, Nihon University |
| 4th Author's Name | Atsushi HIRAI |
| 4th Author's Affiliation | Graduate School of Industrial Technology, Nihon University |
| 5th Author's Name | Toshinori HOSOKAWA |
| 5th Author's Affiliation | College of Industrial Technology, Nihon University |
| 6th Author's Name | Masayoshi YOSHIMURA |
| 6th Author's Affiliation | Faculty of Infomation Science and Electrical Engineering, Kyushu University |
| 7th Author's Name | Koji YAMAZAKI |
| 7th Author's Affiliation | School of Information and Communication, Meiji University |
| Date | 2014-02-10 |
| Paper # | DC2013-89 |
| Volume (vol) | vol.113 |
| Number (no) | 430 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |