Presentation 2014-02-10
An Efficient Test Pattern Generator based on Mersenne Twister algorithm
Sayaka SATONAKA, Hiroshi IWATA, Ken'ichi YAMAGUCHI,
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Abstract(in English) To perform a high reliable manufacturing test with a reasonable cost, LFSR is widely used as test pattern generator. However, the LFSR-based pseudo random patterns are not suitable for sequential circuits. In this paper, we supposed that the Mersenne Twister is used as the test pattern generator instead of the LFSR to implement BIST into VLSIs. Mersenne Twister is one of pseudo random number generation algorithm and has the two advantages that are good randomness and huge period. Experimental results show that the test patterns generated through the Mersenne Twister are efficient with respect to the fault coverage and it is implemented with a comparable cost to the LFSR.
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Keyword(in English) Manufacturing Test / BIST / Test Pattern Generator / Linear Feedback Shift Register / Mersenne Twister
Paper # DC2013-86
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Committee DC
Conference Date 2014/2/3(1days)
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Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) An Efficient Test Pattern Generator based on Mersenne Twister algorithm
Sub Title (in English)
Keyword(1) Manufacturing Test
Keyword(2) BIST
Keyword(3) Test Pattern Generator
Keyword(4) Linear Feedback Shift Register
Keyword(5) Mersenne Twister
1st Author's Name Sayaka SATONAKA
1st Author's Affiliation Faculty of Advanced Engineering, Nara National College of Technology()
2nd Author's Name Hiroshi IWATA
2nd Author's Affiliation Department of Infomation Engineering, Nara National College of Technology
3rd Author's Name Ken'ichi YAMAGUCHI
3rd Author's Affiliation Department of Infomation Engineering, Nara National College of Technology
Date 2014-02-10
Paper # DC2013-86
Volume (vol) vol.113
Number (no) 430
Page pp.pp.-
#Pages 6
Date of Issue