Presentation	2014-02-10 Device-parameter Estimation Based on F_ Testing Michihiro SHINTANI, Takashi SATO,
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Abstract(in English)	Post-fabrication performance compensation and adaptive delay testing are effective means to improve yield and reliability of LSIs. In these methods, the estimation of device-parameters, such as threshold voltages, plays a key role. In this paper, we propose a novel technique to realize accurate device-parameter estimation through F_ testing. In the proposed method, statistical path delay distributions of sensitized paths in F_ testing are utilized, and device-parameters are calculated so that they most likely explains the result obtained from F_ testing. Two estimation methods are proposed: one is based on the discrete Bayes estimation and the other is based on maximum likelihood estimation. No additional circuit and no additional measurements are required for the purpose of the estimation. Numerical experiments demonstrate that both methods achieve 3mV accuracy in estimating threshold voltages. Considering their computational costs, the method based on the maximum likelihood estimation is more preferable.
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Keyword(in English)	F_ testing / statistical static timing analysis / bayesian estimation / maximum likelihood estimation
Paper #	DC2013-85
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Committee	DC
Conference Date	2014/2/3(1days)
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Paper Information
Registration To	Dependable Computing (DC)
Language	JPN
Title (in Japanese)	(See Japanese page)
Sub Title (in Japanese)	(See Japanese page)
Title (in English)	Device-parameter Estimation Based on F_ Testing
Sub Title (in English)
Keyword(1)	F_ testing
Keyword(2)	statistical static timing analysis
Keyword(3)	bayesian estimation
Keyword(4)	maximum likelihood estimation
1st Author's Name	Michihiro SHINTANI
1st Author's Affiliation	Graduate School of Informatics, Kyoto University()
2nd Author's Name	Takashi SATO
2nd Author's Affiliation	Graduate School of Informatics, Kyoto University
Date	2014-02-10
Paper #	DC2013-85
Volume (vol)	vol.113
Number (no)	430
Page	pp.pp.-
#Pages	6
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