Presentation | 2014-02-10 A Low Power Dissipation Oriented Don't Care Filling Method Using SAT Yoshiyasu TAKAHASHI, Hiroshi YAMAZAKI, Toshinori HOSOKAWA, Masayoshi YOSHIMURA, |
---|---|
PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | High power dissipation can occur by high launch-induced switching activity when the response to a test pattern is captured by flip-flops in at-speed scan testing, resulting in excessive IR drop, which may cause significant capture-induced yield loss in the deep submicron era. It is known that test modification methods using X-identification and X-filling are effective to reduce capture power dissipation. Conventional low power dissipation oriented X-filling methods are consecutively conducted for each flip-flop to reduce the number of transition at flip-flops. In this paper, we propose a novel low power dissipation oriented X-filling method using SAT engine which conducts simultaneous X-filling for some flip-flops. Experimental results show that the proposed method was effective for ISCAS'89 and ITC'99 benchmark circuits compared with justification-probability-based fill. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | transition faults / capture power consumption / don't care filling / Satisfiability Problem |
Paper # | DC2013-83 |
Date of Issue |
Conference Information | |
Committee | DC |
---|---|
Conference Date | 2014/2/3(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | |
Chair | |
Vice Chair | |
Secretary | |
Assistant |
Paper Information | |
Registration To | Dependable Computing (DC) |
---|---|
Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A Low Power Dissipation Oriented Don't Care Filling Method Using SAT |
Sub Title (in English) | |
Keyword(1) | transition faults |
Keyword(2) | capture power consumption |
Keyword(3) | don't care filling |
Keyword(4) | Satisfiability Problem |
1st Author's Name | Yoshiyasu TAKAHASHI |
1st Author's Affiliation | Graduate School of Industrial Technology, Nihon University() |
2nd Author's Name | Hiroshi YAMAZAKI |
2nd Author's Affiliation | Graduate School of Industrial Technology, Nihon University |
3rd Author's Name | Toshinori HOSOKAWA |
3rd Author's Affiliation | College of Industrial Technology, Nihon University |
4th Author's Name | Masayoshi YOSHIMURA |
4th Author's Affiliation | Faculty of Information Science and Electrical Engineering, Kyushu University |
Date | 2014-02-10 |
Paper # | DC2013-83 |
Volume (vol) | vol.113 |
Number (no) | 430 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |