Presentation 2014-02-10
A Low Power Dissipation Oriented Don't Care Filling Method Using SAT
Yoshiyasu TAKAHASHI, Hiroshi YAMAZAKI, Toshinori HOSOKAWA, Masayoshi YOSHIMURA,
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Abstract(in English) High power dissipation can occur by high launch-induced switching activity when the response to a test pattern is captured by flip-flops in at-speed scan testing, resulting in excessive IR drop, which may cause significant capture-induced yield loss in the deep submicron era. It is known that test modification methods using X-identification and X-filling are effective to reduce capture power dissipation. Conventional low power dissipation oriented X-filling methods are consecutively conducted for each flip-flop to reduce the number of transition at flip-flops. In this paper, we propose a novel low power dissipation oriented X-filling method using SAT engine which conducts simultaneous X-filling for some flip-flops. Experimental results show that the proposed method was effective for ISCAS'89 and ITC'99 benchmark circuits compared with justification-probability-based fill.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) transition faults / capture power consumption / don't care filling / Satisfiability Problem
Paper # DC2013-83
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Committee DC
Conference Date 2014/2/3(1days)
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Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Low Power Dissipation Oriented Don't Care Filling Method Using SAT
Sub Title (in English)
Keyword(1) transition faults
Keyword(2) capture power consumption
Keyword(3) don't care filling
Keyword(4) Satisfiability Problem
1st Author's Name Yoshiyasu TAKAHASHI
1st Author's Affiliation Graduate School of Industrial Technology, Nihon University()
2nd Author's Name Hiroshi YAMAZAKI
2nd Author's Affiliation Graduate School of Industrial Technology, Nihon University
3rd Author's Name Toshinori HOSOKAWA
3rd Author's Affiliation College of Industrial Technology, Nihon University
4th Author's Name Masayoshi YOSHIMURA
4th Author's Affiliation Faculty of Information Science and Electrical Engineering, Kyushu University
Date 2014-02-10
Paper # DC2013-83
Volume (vol) vol.113
Number (no) 430
Page pp.pp.-
#Pages 6
Date of Issue