Presentation 2014-02-10
Module Coupling Overhead Aware Scan Chain Construction
Meguru KOMATSU, Hiroshi IWATA, Ken'ich YAMAGUCHI,
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Abstract(in English) It is necessary to minimize the impact on the layout of the design changes to Design for Testability (DFT). Especially, the skewed-load delay fault testing and asynchronous L1L2^* scan design have constraints on the connection order of scan chains in order to improve the fault coverage. Therefore, module independences are missing because of the restrictions on the connection order of the scan chain. In this paper, we propose a scan chain construction method that takes into account the independence of the module.
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Keyword(in English) Design for Testability / L1L2^* Scan Design / scan chain / bipartite full scan design / module coupling overhead
Paper # DC2013-79
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Conference Date 2014/2/3(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Module Coupling Overhead Aware Scan Chain Construction
Sub Title (in English)
Keyword(1) Design for Testability
Keyword(2) L1L2^* Scan Design
Keyword(3) scan chain
Keyword(4) bipartite full scan design
Keyword(5) module coupling overhead
1st Author's Name Meguru KOMATSU
1st Author's Affiliation Faculty of Advanced Engineering, Nara National Collage of Technology()
2nd Author's Name Hiroshi IWATA
2nd Author's Affiliation Department of Information Engineering, Nara National Collage of Technology
3rd Author's Name Ken'ich YAMAGUCHI
3rd Author's Affiliation Department of Information Engineering, Nara National Collage of Technology
Date 2014-02-10
Paper # DC2013-79
Volume (vol) vol.113
Number (no) 430
Page pp.pp.-
#Pages 5
Date of Issue