Presentation 2014-01-24
Static and dynamic characteristics of surface plasmon detector-MOSFET integrated circuit
Takuma AIHARA, Ayumi TAKEDA, Masashi FUKUHARA, Yuya ISHII, Mitsuo FUKUDA,
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Abstract(in English) Optical interconnections (OIs) in integrated circuits have been developed for high-speed and large-capacity date-processing applications. Surface plasmons (SPs) are attractive as information carriers for the OIs because SPs confine optical energy within a nano-scale area beyond the diffraction limit of light. We have developed a SP detector consisting of a gold-silicon Schottky diode with a nano-slit grating. In this study, we demonstrate a monolithic integration of the SP detector and metal-oxide-semiconductor field-effect transistors (MOSFETs), and discuss its static and dynamic operations.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Surface plasmon / optoelectronic integrated circuit / Schottky diode / grating
Paper # PN2013-82,OPE2013-196,LQE2013-182,EST2013-131,MWP2013-102
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Committee OPE
Conference Date 2014/1/16(1days)
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Registration To Optoelectronics (OPE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Static and dynamic characteristics of surface plasmon detector-MOSFET integrated circuit
Sub Title (in English)
Keyword(1) Surface plasmon
Keyword(2) optoelectronic integrated circuit
Keyword(3) Schottky diode
Keyword(4) grating
1st Author's Name Takuma AIHARA
1st Author's Affiliation Toyohashi University of Technology()
2nd Author's Name Ayumi TAKEDA
2nd Author's Affiliation Toyohashi University of Technology
3rd Author's Name Masashi FUKUHARA
3rd Author's Affiliation Toyohashi University of Technology
4th Author's Name Yuya ISHII
4th Author's Affiliation Toyohashi University of Technology
5th Author's Name Mitsuo FUKUDA
5th Author's Affiliation Toyohashi University of Technology
Date 2014-01-24
Paper # PN2013-82,OPE2013-196,LQE2013-182,EST2013-131,MWP2013-102
Volume (vol) vol.113
Number (no) 394
Page pp.pp.-
#Pages 4
Date of Issue