Presentation 2014-01-24
Accurate fabrication of low-loss SFBGs assisted by multivariate structure identification
Tomoya HAGIHARA, Masanori HANAWA,
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Abstract(in English) Phase differences between two FBGs of low-loss sampled fiber Bragg gratings (SFBGs) are identified and the phase differences are calibrated by the phase trimming method. The phase differences, which are determined by optical lengths between two adjacent FBGs, are the most important parameter in SFBG fabrication. The frequency of estimation error of phase difference within 0.05π for low-loss 4-chip SFBGs has been improved from 56% to 78% by using the downhill simplex method (DHS) instead of LMS algorithm. The calculation amount was also reduced 40 times. The average of maximum phase error for fabricated low-loss 4-chip SFBGs was 0.14π by using the DHS. In addition, fabrication result of low-loss 8-chip SFBG is shown.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Sampled FBG / Multivariate structure identification / Phase difference / Phase trimming
Paper # PN2013-75,OPE2013-189,LQE2013-175,EST2013-124,MWP2013-95
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Conference Information
Committee OPE
Conference Date 2014/1/16(1days)
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Paper Information
Registration To Optoelectronics (OPE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Accurate fabrication of low-loss SFBGs assisted by multivariate structure identification
Sub Title (in English)
Keyword(1) Sampled FBG
Keyword(2) Multivariate structure identification
Keyword(3) Phase difference
Keyword(4) Phase trimming
1st Author's Name Tomoya HAGIHARA
1st Author's Affiliation University of Yamanashi()
2nd Author's Name Masanori HANAWA
2nd Author's Affiliation University of Yamanashi
Date 2014-01-24
Paper # PN2013-75,OPE2013-189,LQE2013-175,EST2013-124,MWP2013-95
Volume (vol) vol.113
Number (no) 394
Page pp.pp.-
#Pages 6
Date of Issue