Presentation 2014-01-28
Evaluation of Threshold Levels using Complexity Distributions in BPCS Steganography Technique
Syouhei HARADA, Shingo SHIMAURA, Seok KANG, Yuji SAKAMOTO,
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Abstract(in English) It is necessary to reduce two variance values of the degradation level of stego images and the embedding rate in steganography techniques. We proposed a technique in revaluating threshold levels for judging complexity boundary. This technique can be achieved by determining the complexity distributions, which is consisted by the complexity gained by the judgment of complexity, and the number of macroblocks having the complexity in the BPCS steganography technique, and confirmed the effectiveness. However, parameters used in reevaluation of threshold levels aren't in correlation with the complexity distributions and are set arbitrarily. In this paper, we proposed technique parameters set automatically by a standard deviation of a normal distribution and confirmed the effectiveness by the experiments.
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Keyword(in English) Steganography technique / Bit-plane decomposition / Distributions of complexity
Paper # EMM2013-94
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Committee EMM
Conference Date 2014/1/20(1days)
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Registration To Enriched Multimedia (EMM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Evaluation of Threshold Levels using Complexity Distributions in BPCS Steganography Technique
Sub Title (in English)
Keyword(1) Steganography technique
Keyword(2) Bit-plane decomposition
Keyword(3) Distributions of complexity
1st Author's Name Syouhei HARADA
1st Author's Affiliation Graduate School of Information Science and Technology, Hokkaido University()
2nd Author's Name Shingo SHIMAURA
2nd Author's Affiliation Graduate School of Information Science and Technology, Hokkaido University
3rd Author's Name Seok KANG
3rd Author's Affiliation Graduate School of Information Science and Technology, Hokkaido University
4th Author's Name Yuji SAKAMOTO
4th Author's Affiliation Graduate School of Information Science and Technology, Hokkaido University
Date 2014-01-28
Paper # EMM2013-94
Volume (vol) vol.113
Number (no) 415
Page pp.pp.-
#Pages 6
Date of Issue