Presentation | 2013-10-23 Photoassisted Electron Emission from Silicon Cathodes Hidetaka Shimawaki, Yoichiro Neo, Hidenori Mimura, Fujio Wakaya, Mikio Takai, Tomoya Yoshida, Masayoshi Nagao, |
---|---|
PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | The photo response of electron emission from nanocrystalline silicon based Metal-oxide-semiconductor (MOS) cathodes and gated Si field emitter arrays have been investigated under irradiation of laser pulses with the wavelengths of 633 nm and 405 nm. A modulated electron beam is generated directly from the each cathode device by laser pulses. The rise time of the photo response in the MOS cathode device is at least on nanosecond scale. In addition, this paper shows that the gated field emitter structure designed with gate aperture less than a half micrometer blocks effectively excitation of diffusion electrons outside the depletion region which causes slow response. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | photoassisted electron emission / modulated electron beam / MOS cathode / field emitter array |
Paper # | ED2013-57 |
Date of Issue |
Conference Information | |
Committee | ED |
---|---|
Conference Date | 2013/10/15(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | |
Chair | |
Vice Chair | |
Secretary | |
Assistant |
Paper Information | |
Registration To | Electron Devices (ED) |
---|---|
Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Photoassisted Electron Emission from Silicon Cathodes |
Sub Title (in English) | |
Keyword(1) | photoassisted electron emission |
Keyword(2) | modulated electron beam |
Keyword(3) | MOS cathode |
Keyword(4) | field emitter array |
1st Author's Name | Hidetaka Shimawaki |
1st Author's Affiliation | Faculty of Engineering,Hachinohe Institute of Technology() |
2nd Author's Name | Yoichiro Neo |
2nd Author's Affiliation | Research Institute of Electronics,Shizuoka University |
3rd Author's Name | Hidenori Mimura |
3rd Author's Affiliation | Research Institute of Electronics,Shizuoka University |
4th Author's Name | Fujio Wakaya |
4th Author's Affiliation | Center for Quantum Science and Technology under Extreme Conditions,Osaka University |
5th Author's Name | Mikio Takai |
5th Author's Affiliation | Center for Quantum Science and Technology under Extreme Conditions,Osaka University |
6th Author's Name | Tomoya Yoshida |
6th Author's Affiliation | National Institute of Advanced Industrial Science and Technology |
7th Author's Name | Masayoshi Nagao |
7th Author's Affiliation | National Institute of Advanced Industrial Science and Technology |
Date | 2013-10-23 |
Paper # | ED2013-57 |
Volume (vol) | vol.113 |
Number (no) | 257 |
Page | pp.pp.- |
#Pages | 4 |
Date of Issue |