Presentation | 2013-10-24 Influence of self-heating on oscillation phenomena of Bi-2212 intrinsic Josephson junctions Tubasa Nishikata, Yukio Kotaki, Takahiro Kato, Hiroki Ishida, Hisayuki Suematsu, Yasui Kannji /, Akira Kawakami, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | We have been successfully fabricated an integrated THz oscillator stack with detector stack in Bi_2Sr_2CaCu_2O_<8+δ> (Bi-2212) single crystal by using photolithography and dilute acid solution (pH=1.65). These stacks were formed in a same crystal, which were isolated by BiOCl crystal. Lateral dimensions of the oscillator IJJ stacks were more than several hundred μm^2, while detector stack was about 10×10 μm^2. In order to confirm emission of electromagnetic waves from the oscillator stack, a zero voltage current for the detector stack was measured while sweeping DC bias of the oscillator stack. In liquid nitrogen, we found that the zero voltage current of the detector stacks was strongly suppressed when the oscillator stacks was biased at hump structure in the I-V curve. However, the hump structure could not been observed at 77 K achieved by cooling gas such as N_2 or He. This result indicates that the oscillation characteristics in the large sized Bi-2212 IJJs have a strong influence on cooling method. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Terahartz / Josephson junction /Bi_2Sr_2CaCu_2O_x(Bi-2212) |
Paper # | CPM2013-94 |
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Committee | CPM |
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Conference Date | 2013/10/17(1days) |
Place (in Japanese) | (See Japanese page) |
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Registration To | Component Parts and Materials (CPM) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Influence of self-heating on oscillation phenomena of Bi-2212 intrinsic Josephson junctions |
Sub Title (in English) | |
Keyword(1) | Terahartz |
Keyword(2) | Josephson junction /Bi_2Sr_2CaCu_2O_x(Bi-2212) |
1st Author's Name | Tubasa Nishikata |
1st Author's Affiliation | Department of Electrical Engineering,Nagaoka University of Technology() |
2nd Author's Name | Yukio Kotaki |
2nd Author's Affiliation | Department of Electrical Engineering,Nagaoka University of Technology |
3rd Author's Name | Takahiro Kato |
3rd Author's Affiliation | Department of Electrical Engineering,Nagaoka University of Technology |
4th Author's Name | Hiroki Ishida |
4th Author's Affiliation | Department of Electronics and Computer Engineering,Toyama National College of Technology |
5th Author's Name | Hisayuki Suematsu |
5th Author's Affiliation | Department of Electrical Engineering,Nagaoka University of Technology |
6th Author's Name | Yasui Kannji / |
6th Author's Affiliation | / Department of Electrical Engineering,Nagaoka University of Technology |
7th Author's Name | Akira Kawakami |
7th Author's Affiliation | Kobe Advanced ICT Research Center,National Institute of and Communications Technology |
Date | 2013-10-24 |
Paper # | CPM2013-94 |
Volume (vol) | vol.113 |
Number (no) | 268 |
Page | pp.pp.- |
#Pages | 5 |
Date of Issue |