Presentation 2013-10-24
Influence of self-heating on oscillation phenomena of Bi-2212 intrinsic Josephson junctions
Tubasa Nishikata, Yukio Kotaki, Takahiro Kato, Hiroki Ishida, Hisayuki Suematsu, Yasui Kannji /, Akira Kawakami,
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Abstract(in English) We have been successfully fabricated an integrated THz oscillator stack with detector stack in Bi_2Sr_2CaCu_2O_<8+δ> (Bi-2212) single crystal by using photolithography and dilute acid solution (pH=1.65). These stacks were formed in a same crystal, which were isolated by BiOCl crystal. Lateral dimensions of the oscillator IJJ stacks were more than several hundred μm^2, while detector stack was about 10×10 μm^2. In order to confirm emission of electromagnetic waves from the oscillator stack, a zero voltage current for the detector stack was measured while sweeping DC bias of the oscillator stack. In liquid nitrogen, we found that the zero voltage current of the detector stacks was strongly suppressed when the oscillator stacks was biased at hump structure in the I-V curve. However, the hump structure could not been observed at 77 K achieved by cooling gas such as N_2 or He. This result indicates that the oscillation characteristics in the large sized Bi-2212 IJJs have a strong influence on cooling method.
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Keyword(in English) Terahartz / Josephson junction /Bi_2Sr_2CaCu_2O_x(Bi-2212)
Paper # CPM2013-94
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Committee CPM
Conference Date 2013/10/17(1days)
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Registration To Component Parts and Materials (CPM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Influence of self-heating on oscillation phenomena of Bi-2212 intrinsic Josephson junctions
Sub Title (in English)
Keyword(1) Terahartz
Keyword(2) Josephson junction /Bi_2Sr_2CaCu_2O_x(Bi-2212)
1st Author's Name Tubasa Nishikata
1st Author's Affiliation Department of Electrical Engineering,Nagaoka University of Technology()
2nd Author's Name Yukio Kotaki
2nd Author's Affiliation Department of Electrical Engineering,Nagaoka University of Technology
3rd Author's Name Takahiro Kato
3rd Author's Affiliation Department of Electrical Engineering,Nagaoka University of Technology
4th Author's Name Hiroki Ishida
4th Author's Affiliation Department of Electronics and Computer Engineering,Toyama National College of Technology
5th Author's Name Hisayuki Suematsu
5th Author's Affiliation Department of Electrical Engineering,Nagaoka University of Technology
6th Author's Name Yasui Kannji /
6th Author's Affiliation / Department of Electrical Engineering,Nagaoka University of Technology
7th Author's Name Akira Kawakami
7th Author's Affiliation Kobe Advanced ICT Research Center,National Institute of and Communications Technology
Date 2013-10-24
Paper # CPM2013-94
Volume (vol) vol.113
Number (no) 268
Page pp.pp.-
#Pages 5
Date of Issue