Presentation | 2013-10-03 Study on single-flux-quantum readout circuits for time-of-flight mass spectrometry systems using superconducting stripline ion detectors Nobuyuki YOSHIKAWA, Kyosuke SANO, Yuki YAMANASHI, Nobuyuki ZEN, Masataka OKUBO, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | We are developing a time-of-flight mass-spectrometry (TOF-MS) system using a superconducting stripline ion detector (SSID) and single-flux-quantum (SFQ) time-to-digital converter (TDC). In this study, we implemented a TOF-MS system composed of an SSID and an SFQ readout circuit to demonstrate the TOF-MS of biomolecules. An SFQ circuit, which consists of a current discriminator, a Josephson transmission line and an SFQ-DC converter, was fabricate using the AIST Nb standard process, and integrated with a meander-shaped NbN SSID of the area of 200μm square in a cryostat. Dependence of the dark count rate of the SSID on the bias current measured by the SFQ readout circuit exhibits the exponential dependence in the wide range, which shows the validity of the SFQ readout circuits. Mass spectrum of biomolecules, whose weight is 1296, was measured using the system by the matrix-assisted laser desorption ionization method and a clear corresponding peak was observed. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | TOF-MS / SSID / SFQ readout circuits / Josephson integrated circuits |
Paper # | SCE2013-32 |
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Committee | SCE |
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Conference Date | 2013/9/25(1days) |
Place (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Superconductive Electronics (SCE) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Study on single-flux-quantum readout circuits for time-of-flight mass spectrometry systems using superconducting stripline ion detectors |
Sub Title (in English) | |
Keyword(1) | TOF-MS |
Keyword(2) | SSID |
Keyword(3) | SFQ readout circuits |
Keyword(4) | Josephson integrated circuits |
1st Author's Name | Nobuyuki YOSHIKAWA |
1st Author's Affiliation | Graduate School of Engineering,Yokohama National University() |
2nd Author's Name | Kyosuke SANO |
2nd Author's Affiliation | Graduate School of Engineering,Yokohama National University |
3rd Author's Name | Yuki YAMANASHI |
3rd Author's Affiliation | Graduate School of Engineering,Yokohama National University |
4th Author's Name | Nobuyuki ZEN |
4th Author's Affiliation | AIST |
5th Author's Name | Masataka OKUBO |
5th Author's Affiliation | AIST |
Date | 2013-10-03 |
Paper # | SCE2013-32 |
Volume (vol) | vol.113 |
Number (no) | 232 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |