Presentation 2013-10-03
Study on single-flux-quantum readout circuits for time-of-flight mass spectrometry systems using superconducting stripline ion detectors
Nobuyuki YOSHIKAWA, Kyosuke SANO, Yuki YAMANASHI, Nobuyuki ZEN, Masataka OKUBO,
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Abstract(in English) We are developing a time-of-flight mass-spectrometry (TOF-MS) system using a superconducting stripline ion detector (SSID) and single-flux-quantum (SFQ) time-to-digital converter (TDC). In this study, we implemented a TOF-MS system composed of an SSID and an SFQ readout circuit to demonstrate the TOF-MS of biomolecules. An SFQ circuit, which consists of a current discriminator, a Josephson transmission line and an SFQ-DC converter, was fabricate using the AIST Nb standard process, and integrated with a meander-shaped NbN SSID of the area of 200μm square in a cryostat. Dependence of the dark count rate of the SSID on the bias current measured by the SFQ readout circuit exhibits the exponential dependence in the wide range, which shows the validity of the SFQ readout circuits. Mass spectrum of biomolecules, whose weight is 1296, was measured using the system by the matrix-assisted laser desorption ionization method and a clear corresponding peak was observed.
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Keyword(in English) TOF-MS / SSID / SFQ readout circuits / Josephson integrated circuits
Paper # SCE2013-32
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Conference Information
Committee SCE
Conference Date 2013/9/25(1days)
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Paper Information
Registration To Superconductive Electronics (SCE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Study on single-flux-quantum readout circuits for time-of-flight mass spectrometry systems using superconducting stripline ion detectors
Sub Title (in English)
Keyword(1) TOF-MS
Keyword(2) SSID
Keyword(3) SFQ readout circuits
Keyword(4) Josephson integrated circuits
1st Author's Name Nobuyuki YOSHIKAWA
1st Author's Affiliation Graduate School of Engineering,Yokohama National University()
2nd Author's Name Kyosuke SANO
2nd Author's Affiliation Graduate School of Engineering,Yokohama National University
3rd Author's Name Yuki YAMANASHI
3rd Author's Affiliation Graduate School of Engineering,Yokohama National University
4th Author's Name Nobuyuki ZEN
4th Author's Affiliation AIST
5th Author's Name Masataka OKUBO
5th Author's Affiliation AIST
Date 2013-10-03
Paper # SCE2013-32
Volume (vol) vol.113
Number (no) 232
Page pp.pp.-
#Pages 6
Date of Issue