| Presentation | 2013-06-21 EMC of Semiconductor Integrated Circuits : Macro-modeling and International Standardization Osami WADA, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In this report, overviewed are the measurement and modeling methods for evaluation of EMC characteristics of integrated circuits, which has been investigated by the author's research group to realize reduction of unintentional electromagnetic noise generated by the operation of high-speed digital electronic devices and circuits. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Integrated Circuit / Macro-model / EMC Simulation / EMC Measurement / International Standard |
| Paper # | EMCJ2013-26 |
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| Conference Information | |
| Committee | EMCJ |
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| Conference Date | 2013/6/14(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Electromagnetic Compatibility (EMCJ) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | EMC of Semiconductor Integrated Circuits : Macro-modeling and International Standardization |
| Sub Title (in English) | |
| Keyword(1) | Integrated Circuit |
| Keyword(2) | Macro-model |
| Keyword(3) | EMC Simulation |
| Keyword(4) | EMC Measurement |
| Keyword(5) | International Standard |
| 1st Author's Name | Osami WADA |
| 1st Author's Affiliation | Department of Electrical Engineering, Graduate School of Engineering, Kyoto University() |
| Date | 2013-06-21 |
| Paper # | EMCJ2013-26 |
| Volume (vol) | vol.113 |
| Number (no) | 101 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |