| Presentation | 2013-06-21 A method of transistor degradation estimation using ring oscillators Tatsunori IKEDA, Yukiya MIURA, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Aging called Negative Bias Temperature Instability (NBTI), Negative Bias Temperature Instability (NBTI) and Chanel Hot Carrier (CHC) occurs in nanoscale transistors, which is a major factor for degrading the performance of LSIs. Operating speed of transistors is decreased by aging, and LSI malfunctions by a delay in signal propagation. In this paper, we present a method for estimating the amount of increase in delay time and a threshold value per one transistor from change in the period of two ring oscillators by aging. It was verified by circuit simulation that the proposed method can estimate with an error rate of less than 5% of the delay time increase and an error of less than 2% of the threshold voltage increase. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | NBTI / PBTI / CHC / ring oscillators / signal delay |
| Paper # | DC2013-15 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2013/6/14(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A method of transistor degradation estimation using ring oscillators |
| Sub Title (in English) | |
| Keyword(1) | NBTI |
| Keyword(2) | PBTI |
| Keyword(3) | CHC |
| Keyword(4) | ring oscillators |
| Keyword(5) | signal delay |
| 1st Author's Name | Tatsunori IKEDA |
| 1st Author's Affiliation | Graduate School of System Design, Tokyo Metropolitan University() |
| 2nd Author's Name | Yukiya MIURA |
| 2nd Author's Affiliation | Faculty of System Design, Tokyo Metropolitan University:Japan Science and Technology Agency, CREST |
| Date | 2013-06-21 |
| Paper # | DC2013-15 |
| Volume (vol) | vol.113 |
| Number (no) | 104 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |