Presentation 2013-06-21
An Approach of Generating a Test Set to Locate a Pair-Wise Interaction Fault
Takahiro NAGAMOTO, Hideharu KOJIMA, Tatsuhiro TSUCHIYA,
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Abstract(in English) This paper discusses the location of interaction faults in software interaction testing. Specifically, we propose a method of generating a test set that can locate any single pair-wise interaction fault, aimed at reduction of software development cost. In mathematical terms, such a test set is called a locating array. The proposed method works as follows. First, a test set is generated using an existing method for pair-wise testing. Second, pair-wise interactions that cannot be located by the test set are enumerated. Finally, addition of a test case to the test set is repeated until all pair-wise interactions can be located. We apply the proposed method to some examples to compare it with a conventional pair-wise testing method with respect to the number of test cases in resulting test sets. The results of the case study show that the proposed method can enable fault localization at the cost of 2-3 times test set size.
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Keyword(in English) pair-wise testing / interaction faults / locating array
Paper # DC2013-13
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Committee DC
Conference Date 2013/6/14(1days)
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Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) An Approach of Generating a Test Set to Locate a Pair-Wise Interaction Fault
Sub Title (in English)
Keyword(1) pair-wise testing
Keyword(2) interaction faults
Keyword(3) locating array
1st Author's Name Takahiro NAGAMOTO
1st Author's Affiliation Graduate School of Information Science and Technology, Osaka University()
2nd Author's Name Hideharu KOJIMA
2nd Author's Affiliation Graduate School of Information Science and Technology, Osaka University
3rd Author's Name Tatsuhiro TSUCHIYA
3rd Author's Affiliation Graduate School of Information Science and Technology, Osaka University
Date 2013-06-21
Paper # DC2013-13
Volume (vol) vol.113
Number (no) 104
Page pp.pp.-
#Pages 5
Date of Issue