| Presentation | 2013-06-21 A method of deterministic LFSR Seed Generation for Scan-Based BIST Takanori MORIYASU, Satoshi OHTAKE, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | This paper proposes a method of LFSR seed generation for LFSR reseeding of scan-based BIST of VLSI circuits. So far, a scan test pattern detecting some fault is first generated using an ATPG tool and the generated pattern is then converted into a seed. However, the conversion does not always succeed and the fault may not be detected. For a given circuit with scan-based BIST, the proposed method first creates a seed generation model for the circuit. The seed generation model consists of the combinational part of the circuit and the XOR network representing the logic functions of LFSR seed variables for scan flip-flops. LFSR seeds for faults are then generated as test patterns of the seed generation model by using an ATPG tool. In this paper, the effectiveness of the proposed method is shown by experiments using ITC'99 benchmark circuits. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Scan-based BIST / LFSR / reseeding / seed generation / test generation constraint |
| Paper # | DC2013-11 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2013/6/14(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A method of deterministic LFSR Seed Generation for Scan-Based BIST |
| Sub Title (in English) | |
| Keyword(1) | Scan-based BIST |
| Keyword(2) | LFSR |
| Keyword(3) | reseeding |
| Keyword(4) | seed generation |
| Keyword(5) | test generation constraint |
| 1st Author's Name | Takanori MORIYASU |
| 1st Author's Affiliation | Graduate School of Engineering, Oita University() |
| 2nd Author's Name | Satoshi OHTAKE |
| 2nd Author's Affiliation | Faculty of Engineering, Oita University:CREST, Japan Science and Technology Agency |
| Date | 2013-06-21 |
| Paper # | DC2013-11 |
| Volume (vol) | vol.113 |
| Number (no) | 104 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |