| Presentation | 2013-06-21 A Controller Augmentation Method to Generate Functional k-Time Expansion Models for Data Path Circuits Yusuke KODAMA, Jun NISHIMAKI, Tetuya MASUDA, Toshinori HOSOKAWA, Hideo FUJIWARA, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In recent years, various high-level test synthesis methods for Las have been proposed for the improvement in design productivity and test cost reduction. Most of the approaches are to separate a controller and a data path by using scan design, and hence the hardware overhead becomes large. On the other hand, the approach without separation of a controller and a data path usually degrades the testability. To resolve this problem, an approach that augments a controller by adding extra control functions to make a data path easily testable was proposed However, the approach cannot always succeed in generating test sequences with high fault coverage if a general ATPG tool is used without knowing any information of augmented control functions. In this paper, we introduce "easily testable functional k-time expansion models for data paths" and propose a method for augmenting a controller such that easily testable functional k-time expansion models for the data path are generated. Experimental results show the effectiveness of the proposed method. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | non-scan testing / easily testable functional k-time expansion models / controller augmentation / sequential test generation |
| Paper # | DC2013-10 |
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| Committee | DC |
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| Conference Date | 2013/6/14(1days) |
| Place (in Japanese) | (See Japanese page) |
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| Topics (in Japanese) | (See Japanese page) |
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| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Controller Augmentation Method to Generate Functional k-Time Expansion Models for Data Path Circuits |
| Sub Title (in English) | |
| Keyword(1) | non-scan testing |
| Keyword(2) | easily testable functional k-time expansion models |
| Keyword(3) | controller augmentation |
| Keyword(4) | sequential test generation |
| 1st Author's Name | Yusuke KODAMA |
| 1st Author's Affiliation | Graduate School of Industrial Technology, Nihon University() |
| 2nd Author's Name | Jun NISHIMAKI |
| 2nd Author's Affiliation | Graduate School of Industrial Technology, Nihon University |
| 3rd Author's Name | Tetuya MASUDA |
| 3rd Author's Affiliation | College of Industrial Technology, Nihon University |
| 4th Author's Name | Toshinori HOSOKAWA |
| 4th Author's Affiliation | College of Industrial Technology, Nihon University |
| 5th Author's Name | Hideo FUJIWARA |
| 5th Author's Affiliation | Faculty of Informatics, Osaka Gakuin University |
| Date | 2013-06-21 |
| Paper # | DC2013-10 |
| Volume (vol) | vol.113 |
| Number (no) | 104 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |