| Presentation | 2013-07-12 A Study of Reliability Measure Reflecting Smartphone User Satisfaction Yuki Hayano, Kokono Yatagai, Masahiro Hayashi, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Unavailability, which is obtained by multiplying failure frequency (the mean number of outages per a unit time) & MTTR (the mean time from the occurrence of outage to the repair), has been the most popular reliability measure for reliability design of telecommunications networks. However, recent research trends show that it is doubtful whether unavailability is the best reliability measure, because some empirical studies show that user's dissatisfaction is not proportional to unavailability. While a new improved reliability measures already has been proposed, it has also a problem because this improved reliability measure is derived by analyzing the data obtained by questionnaire surveys for the users of a very special old type of telecommunication service. If we want to apply the this measure to design future telecommunications networks, we cannot ignore smartphone service which is the most popular service today and will be in future. Now, in this paper, we first execute the questionnaire survey for smartphone users to verify whether the improved reliability measure can be applied for design of telecommunications networks supplying smartphone service. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Reliability / Unavailability / Failure Frequency / Reliability Measure / Smartphone |
| Paper # | CQ2013-27 |
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| Conference Information | |
| Committee | CQ |
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| Conference Date | 2013/7/4(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Registration To | Communication Quality (CQ) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Study of Reliability Measure Reflecting Smartphone User Satisfaction |
| Sub Title (in English) | |
| Keyword(1) | Reliability |
| Keyword(2) | Unavailability |
| Keyword(3) | Failure Frequency |
| Keyword(4) | Reliability Measure |
| Keyword(5) | Smartphone |
| 1st Author's Name | Yuki Hayano |
| 1st Author's Affiliation | Dept. of Information Netwoking, Knowledge Engineering, Tokyo City University() |
| 2nd Author's Name | Kokono Yatagai |
| 2nd Author's Affiliation | Dept. of Information Netwoking, Knowledge Engineering, Tokyo City University |
| 3rd Author's Name | Masahiro Hayashi |
| 3rd Author's Affiliation | Dept. of Information Netwoking, Knowledge Engineering, Tokyo City University |
| Date | 2013-07-12 |
| Paper # | CQ2013-27 |
| Volume (vol) | vol.113 |
| Number (no) | 123 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |