Presentation 2013-07-19
Complex permittivity measurements for C-, A-, R-plane sapphire substrates in millimeter wave region
Akihito EBATA, Takashi SHIMIZU, Yoshinori KOGAMI,
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Abstract(in English) A sapphire is expected as a good substrate for a low loss millimeter wave circuit such as a superconductor filter, because a good YBCO film can be manufactured on the substrate. In order to design millimeter wave circuits, it is neccessary to obtain the accurate complex permittivity. However, there are few reports of the complex permittivity for sapphire substrates in millimeter wave region. In this paper, the measured complex permittivity values of C-, A- ,R-plane sapphire substrates are presented and are discussed with the crystal structure. These values are measured using the cutoff circular waveguide method in the frequency range of 25-50GHz.
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Keyword(in English) sapphire / complex permittivity measurements / cutoff circular waveguide method / millimeter-wave
Paper # MW2013-87,OPE2013-56,EST2013-51,MWP2013-46
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Committee OPE
Conference Date 2013/7/11(1days)
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Registration To Optoelectronics (OPE)
Language JPN
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Title (in English) Complex permittivity measurements for C-, A-, R-plane sapphire substrates in millimeter wave region
Sub Title (in English)
Keyword(1) sapphire
Keyword(2) complex permittivity measurements
Keyword(3) cutoff circular waveguide method
Keyword(4) millimeter-wave
1st Author's Name Akihito EBATA
1st Author's Affiliation Graduated School of Engineering, Utsunomiya University()
2nd Author's Name Takashi SHIMIZU
2nd Author's Affiliation Graduated School of Engineering, Utsunomiya University
3rd Author's Name Yoshinori KOGAMI
3rd Author's Affiliation Graduated School of Engineering, Utsunomiya University
Date 2013-07-19
Paper # MW2013-87,OPE2013-56,EST2013-51,MWP2013-46
Volume (vol) vol.113
Number (no) 142
Page pp.pp.-
#Pages 6
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