Presentation 2013-07-22
Power Spectrum Density Calculation for Integrated Quantum Voltage Noise Source
Masaaki MAEZAWA, Takahiro YAMADA, Chiharu URANO,
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Abstract(in English) We are developing a new implementation of quantum voltage noise source (QVNS), integrated QVNS (IQVNS), for Johnson noise thermometry (JNT), aimed at thermal metrology applications. By using a Fourier analysis method, we have derived a generalized expression for power spectrum densities (PSDs) of IQVNS. The PSD expression has shown that the frequency dependence of PSD becomes weaker as the IQVNS circuit operates faster. Some improvements have been suggested for better properties of the IQVNS PSD used in precise JNT measurements. Characteristics and calculation precision of the IQVNS PSD are discussed quantitatively.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Noise Thermometry / Thermal Metrology / Temperature Standard / Noise Standard / Josephson Junction / Superconducting Integrated Circuit
Paper # SCE2013-16
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Committee SCE
Conference Date 2013/7/15(1days)
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Registration To Superconductive Electronics (SCE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Power Spectrum Density Calculation for Integrated Quantum Voltage Noise Source
Sub Title (in English)
Keyword(1) Noise Thermometry
Keyword(2) Thermal Metrology
Keyword(3) Temperature Standard
Keyword(4) Noise Standard
Keyword(5) Josephson Junction
Keyword(6) Superconducting Integrated Circuit
1st Author's Name Masaaki MAEZAWA
1st Author's Affiliation AIST()
2nd Author's Name Takahiro YAMADA
2nd Author's Affiliation AIST
3rd Author's Name Chiharu URANO
3rd Author's Affiliation AIST
Date 2013-07-22
Paper # SCE2013-16
Volume (vol) vol.113
Number (no) 149
Page pp.pp.-
#Pages 6
Date of Issue