Presentation | 2013-07-22 Evaluation of Energy Dissipation and Bit-Error-Rate of Adiabatic Quantum-Flux-Parametron Logic with Under-Damped Junctions Naoki TAKEUCHI, Yuki YAMANASHI, Nobuyuki YOSHIKAWA, |
---|---|
PDF Download Page | ![]() |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Adiabatic quantum-flux-parametron (AQFP) logic is ultimately energy-efficient. The bit energy and bit-error-rate (BER) of AQFP gates with under-damped Josephson junctions were simulated. The results indicate that the bit energy reaches 12 yJ, which is only 20% of the thermal energy at 4.2 K, using unshunted 50 μA junctions and excitation currents with a rise/fall time of 2000 ps. Although the bit energy is extremely small, the bias margin, where the BER is less than 10^<-23>, is approximately ±22%. These results confirm there is no minimum energy limitation for the operation of AQFP gates unless the entropy of the system decreases. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | QFP / adiabatic circuits / low power / bit energy |
Paper # | SCE2013-13 |
Date of Issue |
Conference Information | |
Committee | SCE |
---|---|
Conference Date | 2013/7/15(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | |
Chair | |
Vice Chair | |
Secretary | |
Assistant |
Paper Information | |
Registration To | Superconductive Electronics (SCE) |
---|---|
Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Evaluation of Energy Dissipation and Bit-Error-Rate of Adiabatic Quantum-Flux-Parametron Logic with Under-Damped Junctions |
Sub Title (in English) | |
Keyword(1) | QFP |
Keyword(2) | adiabatic circuits |
Keyword(3) | low power |
Keyword(4) | bit energy |
1st Author's Name | Naoki TAKEUCHI |
1st Author's Affiliation | Dept. of Electrical and Computer Engin., Yokohama National University() |
2nd Author's Name | Yuki YAMANASHI |
2nd Author's Affiliation | Dept. of Electrical and Computer Engin., Yokohama National University |
3rd Author's Name | Nobuyuki YOSHIKAWA |
3rd Author's Affiliation | Dept. of Electrical and Computer Engin., Yokohama National University |
Date | 2013-07-22 |
Paper # | SCE2013-13 |
Volume (vol) | vol.113 |
Number (no) | 149 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |