Presentation 2013-05-17
Observation of damage shapes caused by break arcs on Ag and AgSnO_2 contact surfaces during switching operations
Makoto Hasegawa, Keisuke Takahashi, Daichi Kawamura, Yuya Hirano,
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Abstract(in English) An evaluation system enabling observation and evaluation of changes on contact surface conditions (growth of a crater and/or a pip) during switching operations has been being constructed. Up to now, evaluation of a movable cathode surface profile by way of an optical cross-section method, as well as observation of the counterpart stationary anode surface by means of a CCD camera, has been realized. For the cathode surfaces, temporal changes in cross-sectional profiles along a particular line over a crater formed on the cathode surface were observed. In this paper, more visual observation of temporal changes in the cathode surface conditions (a crater growth process) during switching operations were tried by drawing three-dimensional images of the movable cathode samples based on data obtained with the optical cross-section method. More specifically, Ag contact pairs and AgSnO_2 contact pairs were operated to break a DC14V-2A or 3A load current in a DC inductive circuit, and changes in the contact surfaces during the switching operations were observed and evaluated.
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Keyword(in English) Optical cross-section method / Electrical contacts / Arc discharge / Material transfer / Erosion
Paper # EMD2013-6
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Committee EMD
Conference Date 2013/5/10(1days)
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Registration To Electromechanical Devices (EMD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Observation of damage shapes caused by break arcs on Ag and AgSnO_2 contact surfaces during switching operations
Sub Title (in English)
Keyword(1) Optical cross-section method
Keyword(2) Electrical contacts
Keyword(3) Arc discharge
Keyword(4) Material transfer
Keyword(5) Erosion
1st Author's Name Makoto Hasegawa
1st Author's Affiliation Chitose Institute of Science and Technology()
2nd Author's Name Keisuke Takahashi
2nd Author's Affiliation Chitose Institute of Science and Technology
3rd Author's Name Daichi Kawamura
3rd Author's Affiliation Chitose Institute of Science and Technology
4th Author's Name Yuya Hirano
4th Author's Affiliation Chitose Institute of Science and Technology
Date 2013-05-17
Paper # EMD2013-6
Volume (vol) vol.113
Number (no) 48
Page pp.pp.-
#Pages 6
Date of Issue