| Presentation | 2013-04-11 Highly Reliable Logic Primitive Gates for Spintronics-Based Logic LSI Y. Tsuji, R. Nebashi, N. Sakimura, A. Morioka, H. Honjo, K. Tokutome, S. Miura, T. Suzuki, S. Fukami, K. Kinoshita, T. Hanyu, T. Endoh, N. Kasai, H. Ohno, T. Sugibayashi, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Implementing redundancy within a Spintronis Primitive Gata (SPG) using multi-terminal DWM cells ensures high reliability for the logic use. The overheads of this technique, such as cell area, read margin, and write power consumption, have also been investigated. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Spintronics / Domain Wall / Integrated Circuit / Primitive Gate / Redundancy |
| Paper # | ICD2013-9 |
| Date of Issue |
| Conference Information | |
| Committee | ICD |
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| Conference Date | 2013/4/4(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Integrated Circuits and Devices (ICD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Highly Reliable Logic Primitive Gates for Spintronics-Based Logic LSI |
| Sub Title (in English) | |
| Keyword(1) | Spintronics |
| Keyword(2) | Domain Wall |
| Keyword(3) | Integrated Circuit |
| Keyword(4) | Primitive Gate |
| Keyword(5) | Redundancy |
| 1st Author's Name | Y. Tsuji |
| 1st Author's Affiliation | NEC Corporation() |
| 2nd Author's Name | R. Nebashi |
| 2nd Author's Affiliation | NEC Corporation |
| 3rd Author's Name | N. Sakimura |
| 3rd Author's Affiliation | NEC Corporation |
| 4th Author's Name | A. Morioka |
| 4th Author's Affiliation | NEC Corporation |
| 5th Author's Name | H. Honjo |
| 5th Author's Affiliation | NEC Corporation |
| 6th Author's Name | K. Tokutome |
| 6th Author's Affiliation | NEC Corporation |
| 7th Author's Name | S. Miura |
| 7th Author's Affiliation | NEC Corporation |
| 8th Author's Name | T. Suzuki |
| 8th Author's Affiliation | Renesus Electronics Corporation |
| 9th Author's Name | S. Fukami |
| 9th Author's Affiliation | Tohoku University |
| 10th Author's Name | K. Kinoshita |
| 10th Author's Affiliation | Tohoku University |
| 11th Author's Name | T. Hanyu |
| 11th Author's Affiliation | Tohoku University |
| 12th Author's Name | T. Endoh |
| 12th Author's Affiliation | Tohoku University |
| 13th Author's Name | N. Kasai |
| 13th Author's Affiliation | Tohoku University |
| 14th Author's Name | H. Ohno |
| 14th Author's Affiliation | Tohoku University |
| 15th Author's Name | T. Sugibayashi |
| 15th Author's Affiliation | NEC Corporation |
| Date | 2013-04-11 |
| Paper # | ICD2013-9 |
| Volume (vol) | vol.113 |
| Number (no) | 1 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |