Presentation | 2013-05-16 A Method of Calculating the Bug-Density Index of Software Developed Repeatedly Toshihiro WATARI, Nobuyuki MATSUDA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | When the software developed repeatedly is debugged, the bug-density will decrease along with the development editions, because the same developers or organizations who detected bugs take steps to cope with the new developments repeatedly. As the actual example, I have observed that the bug-density is approximated by an exponential function with base almost 1 and less than 1, in the long run. In this paper, I analyze the tendency, and study how to calculate the bug-density index in development of the next edition. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | software / quality index / bug-density / exponential trendline |
Paper # | NS2013-19 |
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Committee | NS |
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Conference Date | 2013/5/9(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Network Systems(NS) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A Method of Calculating the Bug-Density Index of Software Developed Repeatedly |
Sub Title (in English) | |
Keyword(1) | software |
Keyword(2) | quality index |
Keyword(3) | bug-density |
Keyword(4) | exponential trendline |
1st Author's Name | Toshihiro WATARI |
1st Author's Affiliation | NTT Network Service Systems Laboratories() |
2nd Author's Name | Nobuyuki MATSUDA |
2nd Author's Affiliation | NTT Network Service Systems Laboratories |
Date | 2013-05-16 |
Paper # | NS2013-19 |
Volume (vol) | vol.113 |
Number (no) | 35 |
Page | pp.pp.- |
#Pages | 5 |
Date of Issue |