| Presentation | 2013-02-19 Blind estimation of blocking artifacts based on correlation between image features and subjective evaluation Masahiro WAKABAYASHI, Jiro KATTO, Naofumi WADA, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In video coding using block transforms, blocking artifacts often occur in compressed images especially at low bit rates. Although PSNR and SSIM are often used as objective quality measures of compressed images, they cannot fully evaluate degradation of image quality affected by the blocking artifacts. In this paper, based on the results of a number of subjective evaluations collected for MPEG-2 compressed image sequences, we evaluate the correlation between image features and subjective evaluations of blocking artifacts. We also investigate an NR-type evaluation method of the blocking artifacts as an application of the above results. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Blocking artifacts / NR-type picture quality assessment / MPEG-2 / SVM |
| Paper # | ITS2012-56,IE2012-136 |
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| Conference Information | |
| Committee | IE |
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| Conference Date | 2013/2/11(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Image Engineering (IE) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Blind estimation of blocking artifacts based on correlation between image features and subjective evaluation |
| Sub Title (in English) | |
| Keyword(1) | Blocking artifacts |
| Keyword(2) | NR-type picture quality assessment |
| Keyword(3) | MPEG-2 |
| Keyword(4) | SVM |
| 1st Author's Name | Masahiro WAKABAYASHI |
| 1st Author's Affiliation | Science and Engineering, Waseda University() |
| 2nd Author's Name | Jiro KATTO |
| 2nd Author's Affiliation | Science and Engineering, Waseda University |
| 3rd Author's Name | Naofumi WADA |
| 3rd Author's Affiliation | SAMSUNG Yokohama Research Institute |
| Date | 2013-02-19 |
| Paper # | ITS2012-56,IE2012-136 |
| Volume (vol) | vol.112 |
| Number (no) | 434 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |