| Presentation | 2013-02-28 In-Situ Temperature Measurements of Joule-Heated Graphene Using Near-Infrared CCD Imaging System Takanari SAITO, Ibuki ATSUMO, Ryutaro SUDA, Mitsuki ITO, Jun-ichi SHIRAKASHI, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | We report temperature distribution of graphene during Joule heating process using in-situ Near-Infrared (NIR) Charge-Coupled Device (CCD) imaging system. Graphene layers were prepared by using mechanical exfoliation of pyrolytic graphite sheet (PGS), which is commercially available from an industrial materials company, and deposited on SiO2/Si substrate with approximately 780 nm thermally grown oxide. The thickness of the graphenes was estimated to be 20-80 nm by using the Fresnel theory. In order to investigate the heating process of the graphene, the temperature of the graphene under current flow was estimated using NIR microscopy with a CCD detector. A hand-made, in-situ experimental setup consists of an IR microscope, a NIR CCD and an image enhancer. The CCD detector is mounted on the IR microscope with objective 20x The experiments were carried out in obscurity. The current heating process applied with constant voltage was performed for the graphene in vacuum, and the temperature distribution of the graphene during NIR emission was successfully detected by in-situ NIR CCD imaging system. The temperature of graphene was detected to be approximately 800 K. These results imply that NIR CCD imaging system is a useful tool for the investigation of the temperature distribution of graphene. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Near-Infrared CCD Imaging / Graphene / In-Situ Measurement / Current-Induced Annealing / Temperature Distribution |
| Paper # | ED2012-142,SDM2012-171 |
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| Committee | ED |
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| Conference Date | 2013/2/20(1days) |
| Place (in Japanese) | (See Japanese page) |
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| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Electron Devices (ED) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | In-Situ Temperature Measurements of Joule-Heated Graphene Using Near-Infrared CCD Imaging System |
| Sub Title (in English) | |
| Keyword(1) | Near-Infrared CCD Imaging |
| Keyword(2) | Graphene |
| Keyword(3) | In-Situ Measurement |
| Keyword(4) | Current-Induced Annealing |
| Keyword(5) | Temperature Distribution |
| 1st Author's Name | Takanari SAITO |
| 1st Author's Affiliation | Department of Electrical and Electronic Engineering, Tokyo University of Agriculture and Technology() |
| 2nd Author's Name | Ibuki ATSUMO |
| 2nd Author's Affiliation | Department of Electrical and Electronic Engineering, Tokyo University of Agriculture and Technology |
| 3rd Author's Name | Ryutaro SUDA |
| 3rd Author's Affiliation | Department of Electrical and Electronic Engineering, Tokyo University of Agriculture and Technology |
| 4th Author's Name | Mitsuki ITO |
| 4th Author's Affiliation | Department of Electrical and Electronic Engineering, Tokyo University of Agriculture and Technology |
| 5th Author's Name | Jun-ichi SHIRAKASHI |
| 5th Author's Affiliation | Department of Electrical and Electronic Engineering, Tokyo University of Agriculture and Technology |
| Date | 2013-02-28 |
| Paper # | ED2012-142,SDM2012-171 |
| Volume (vol) | vol.112 |
| Number (no) | 445 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |