Presentation | 2013/1/10 Analysis of drain leakage current in AIGaN/GaN HEMT Kazuo HAYASHI, Toshiyuki OISHI, Yoshitaka KAMO, Yutaro YAMAGUCHI, Hiroshi OTSUKA, Koji YAMANAKA, Masatoshi NAKAYAMA, Yasuyuki MIYAMOTO, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Traps in GaN layer of AlGaN/GaN HEMTs have been studied by using both experimental data and TCAD simulation Two traps with activation energies of 0.15 and 0.5 eV are estimated from drain current versus drain voltage curves below pinch-off voltage at various temperatures Furthermore, the drain leakage current is found to decrease as the trap density increases From TCAD simulation, the decrease of the drain leakage current results from the increase of conduction band due to the traps with negative charges in GaN layer |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | AlGaN/GaN HEMT / trap / TCAD simulation / drain leakage current |
Paper # | ED2012-125 |
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Conference Information | |
Committee | MW |
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Conference Date | 2013/1/10(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
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Chair | |
Vice Chair | |
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Paper Information | |
Registration To | Microwaves (MW) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Analysis of drain leakage current in AIGaN/GaN HEMT |
Sub Title (in English) | |
Keyword(1) | AlGaN/GaN HEMT |
Keyword(2) | trap |
Keyword(3) | TCAD simulation |
Keyword(4) | drain leakage current |
1st Author's Name | Kazuo HAYASHI |
1st Author's Affiliation | Mitsubishi Electric Corporation.() |
2nd Author's Name | Toshiyuki OISHI |
2nd Author's Affiliation | Mitsubishi Electric Corporation. |
3rd Author's Name | Yoshitaka KAMO |
3rd Author's Affiliation | Mitsubishi Electric Corporation. |
4th Author's Name | Yutaro YAMAGUCHI |
4th Author's Affiliation | Mitsubishi Electric Corporation. |
5th Author's Name | Hiroshi OTSUKA |
5th Author's Affiliation | Mitsubishi Electric Corporation. |
6th Author's Name | Koji YAMANAKA |
6th Author's Affiliation | Mitsubishi Electric Corporation. |
7th Author's Name | Masatoshi NAKAYAMA |
7th Author's Affiliation | Mitsubishi Electric Corporation. |
8th Author's Name | Yasuyuki MIYAMOTO |
8th Author's Affiliation | Tokyo Institute of Technology |
Date | 2013/1/10 |
Paper # | ED2012-125 |
Volume (vol) | vol.112 |
Number (no) | 381 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |