Presentation 2013/1/10
Q Factor Simulation and SSB Noise Measurement for Transmission Line Feedback FET Oscillators with FET Parasitic Elements
Takanari MINAMI, Sonshu SAKIHARA, Tuya WUREN, Hideyuki UEHARA, Takashi OHIRA,
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Abstract(in English) This paper presents Q-factor simulation and SSB noise measurement for transmission line feedback FET oscillators By taking into account the FET parasitic elements, we simulated oscillation conditions, oscillation equilibrium stability predictions and Q-factor for three types of single loop feedback FET oscillators They have topologies 1) without open stub, 2) with an open stub at drain port and 3) topology with stubs at drain and gate ports To verify this simulation, we fabricated the circuits for these topologies and measure SSB noise As the result, the higher Q-factor oscillators exhibit lower SSB noise than that for lower Q-factor ones They agree with Leeson's formula with standard deviation of 0 17 dBrms.
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Keyword(in English) oscillator / SSB noise / Q-factor / transmission line / FET / parasitic element / stub
Paper # ED2012-114
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Conference Date 2013/1/10(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Q Factor Simulation and SSB Noise Measurement for Transmission Line Feedback FET Oscillators with FET Parasitic Elements
Sub Title (in English)
Keyword(1) oscillator
Keyword(2) SSB noise
Keyword(3) Q-factor
Keyword(4) transmission line
Keyword(5) FET
Keyword(6) parasitic element
Keyword(7) stub
1st Author's Name Takanari MINAMI
1st Author's Affiliation Toyohashi University of Technology, Department of Electrical and Electronic Information Engineering()
2nd Author's Name Sonshu SAKIHARA
2nd Author's Affiliation Toyohashi University of Technology, Department of Electrical and Electronic Information Engineering
3rd Author's Name Tuya WUREN
3rd Author's Affiliation Toyohashi University of Technology, Electrical and Electronic Information Engineering
4th Author's Name Hideyuki UEHARA
4th Author's Affiliation Toyohashi University of Technology, Electrical and Electronic Information Engineering
5th Author's Name Takashi OHIRA
5th Author's Affiliation Toyohashi University of Technology, Electrical and Electronic Information Engineering
Date 2013/1/10
Paper # ED2012-114
Volume (vol) vol.112
Number (no) 381
Page pp.pp.-
#Pages 6
Date of Issue