Presentation 2013-01-24
Application of Ultra-Low Field SQUID-NMR/MRISystem to Contaminant Detection
Shingo TSUNAKI, Masaaki YAMAMOTO, Takayuki ABE, Junichi HATTA, Yoshimi HATSUKADE, Saburo TANAKA,
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Abstract(in English) Nuclear magnetic resonance (NMR) and magnetic resonance imaging (MRI) in ultra-low field (ULF) using SQUIDs have attracted attention in recent years because the systems do not require complicated apparatus such as superconducting magnets Thus it can be compact, easy to handle, and inexpensive We have developed an ULF-NMR/MRI system utilizing an HTS-SQUID for an application of contaminant detection in foods In this work, we measured NMR signals from water samples with or without various contaminants, such as stainless steel (SUS304), aluminum, and glass balls using the system In the case of the magnetic contaminants, the whole NMR signal intensity was reduced compared to that from the sample without the contaminant due to the remnant field of the contaminant One-dimensional (1D) MRIs of the samples with non-magnetic contaminants were also measured In the 1D-MRIs, changes of the MRI spectra were measured at center frequency, which corresponded to positions of the contaminants in the sample These results show that the feasibility of the system to detect various contaminants in foods
Keyword(in Japanese) (See Japanese page)
Keyword(in English) HTS-rf-SQUID / NMR / MRI / Ultra-low field / Permanent magnet / Contaminant detection
Paper # SCE2012-36
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Conference Information
Committee SCE
Conference Date 2013/1/17(1days)
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Paper Information
Registration To Superconductive Electronics (SCE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Application of Ultra-Low Field SQUID-NMR/MRISystem to Contaminant Detection
Sub Title (in English)
Keyword(1) HTS-rf-SQUID
Keyword(2) NMR
Keyword(3) MRI
Keyword(4) Ultra-low field
Keyword(5) Permanent magnet
Keyword(6) Contaminant detection
1st Author's Name Shingo TSUNAKI
1st Author's Affiliation Toyohashi University of Technology()
2nd Author's Name Masaaki YAMAMOTO
2nd Author's Affiliation Toyohashi University of Technology
3rd Author's Name Takayuki ABE
3rd Author's Affiliation Toyohashi University of Technology
4th Author's Name Junichi HATTA
4th Author's Affiliation Toyohashi University of Technology
5th Author's Name Yoshimi HATSUKADE
5th Author's Affiliation Toyohashi University of Technology
6th Author's Name Saburo TANAKA
6th Author's Affiliation Toyohashi University of Technology
Date 2013-01-24
Paper # SCE2012-36
Volume (vol) vol.112
Number (no) 408
Page pp.pp.-
#Pages 4
Date of Issue