| Presentation | 2013-01-24 Integrated Quantum Voltage Noise Source for Johnson Noise Thermometry Masaaki MAEZAWA, Takahiro YAMADA, Chiharu URANO, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | A new implementation of quantum voltage noise source (QVNS), integrated QVNS (IQVNS), for Johnson noise thermometry (JNT) is proposed The concept is integration of all the QVNS subsystems on a superconducting integrated circuit chip, eliminating degradation of output voltage accuracy caused by crosstalk On-chip, real-time pseudo-noise generation with IQVNS omits expensive microwave electronics and costly code calculations We have designed an IQVNS chip consisting of rapid single flux quantum circuitry Simulation shows that pseudo-white noise voltages generated by IQVNS are suitable for JNT measurements A promising application of the JNT with IQVNS is re-evaluation of the temperature fixed points after the redefinition of Boltzmann's constant |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Noise Thermometry / Thermal Metrology / Temperature Standard / Noise Standard / Josephson Junction / Superconducting Integrated Circuit |
| Paper # | SCE2012-27 |
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| Conference Information | |
| Committee | SCE |
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| Conference Date | 2013/1/17(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
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| Paper Information | |
| Registration To | Superconductive Electronics (SCE) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Integrated Quantum Voltage Noise Source for Johnson Noise Thermometry |
| Sub Title (in English) | |
| Keyword(1) | Noise Thermometry |
| Keyword(2) | Thermal Metrology |
| Keyword(3) | Temperature Standard |
| Keyword(4) | Noise Standard |
| Keyword(5) | Josephson Junction |
| Keyword(6) | Superconducting Integrated Circuit |
| 1st Author's Name | Masaaki MAEZAWA |
| 1st Author's Affiliation | AIST() |
| 2nd Author's Name | Takahiro YAMADA |
| 2nd Author's Affiliation | AIST |
| 3rd Author's Name | Chiharu URANO |
| 3rd Author's Affiliation | AIST |
| Date | 2013-01-24 |
| Paper # | SCE2012-27 |
| Volume (vol) | vol.112 |
| Number (no) | 408 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |