Presentation 2013-01-10
Investigation of Correlation between Disturbance Current from Module Devices and Radiating Field Strength from Cable
Keniti YANO, Nobuo KUWABARA, Toshiki SHIMAMAKI, Hidenori MURAMATSU, Kengo MORI,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) A method of evaluating disturbances from the module devices, such as hard disk drive and memory board, was investigated to improve the measurement efficiency of the radiating disturbances. The method of measuring a disturbance current appearing the power supply line is proposed. However, disturbances from the information technology equipment are specified by electric field strength. Therefore, the relation between disturbance current and electric field strength should be investigated. In this report, the coefficient, which represents the correlation between the disturbance current and the electric field strength, was investigated by the measurement using the O/E converter and the calculation using the moment method. The results showed that the calculation value almost agreed with measured one, and the electric field was radiated mainly from the cable and the shielding box. As a result of investigation, the coefficient changed periodically in the case of the radiation from the cable although the coefficient increases in proportion to the square of the frequency in the case of USB memory.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) O/E converter / UTP cable / USB memory
Paper # EMCJ2012-113
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Conference Information
Committee EMCJ
Conference Date 2013/1/3(1days)
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Paper Information
Registration To Electromagnetic Compatibility (EMCJ)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Investigation of Correlation between Disturbance Current from Module Devices and Radiating Field Strength from Cable
Sub Title (in English)
Keyword(1) O/E converter
Keyword(2) UTP cable
Keyword(3) USB memory
1st Author's Name Keniti YANO
1st Author's Affiliation Kyushu Institute Technology()
2nd Author's Name Nobuo KUWABARA
2nd Author's Affiliation Kyushu Institute Technology
3rd Author's Name Toshiki SHIMAMAKI
3rd Author's Affiliation NEC Engineering, Ltd
4th Author's Name Hidenori MURAMATSU
4th Author's Affiliation VCCI Council
5th Author's Name Kengo MORI
5th Author's Affiliation I-O DATA DEVIC
Date 2013-01-10
Paper # EMCJ2012-113
Volume (vol) vol.112
Number (no) 372
Page pp.pp.-
#Pages 6
Date of Issue