Presentation | 2013-01-10 Investigation of Correlation between Disturbance Current from Module Devices and Radiating Field Strength from Cable Keniti YANO, Nobuo KUWABARA, Toshiki SHIMAMAKI, Hidenori MURAMATSU, Kengo MORI, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | A method of evaluating disturbances from the module devices, such as hard disk drive and memory board, was investigated to improve the measurement efficiency of the radiating disturbances. The method of measuring a disturbance current appearing the power supply line is proposed. However, disturbances from the information technology equipment are specified by electric field strength. Therefore, the relation between disturbance current and electric field strength should be investigated. In this report, the coefficient, which represents the correlation between the disturbance current and the electric field strength, was investigated by the measurement using the O/E converter and the calculation using the moment method. The results showed that the calculation value almost agreed with measured one, and the electric field was radiated mainly from the cable and the shielding box. As a result of investigation, the coefficient changed periodically in the case of the radiation from the cable although the coefficient increases in proportion to the square of the frequency in the case of USB memory. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | O/E converter / UTP cable / USB memory |
Paper # | EMCJ2012-113 |
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Conference Information | |
Committee | EMCJ |
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Conference Date | 2013/1/3(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Electromagnetic Compatibility (EMCJ) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Investigation of Correlation between Disturbance Current from Module Devices and Radiating Field Strength from Cable |
Sub Title (in English) | |
Keyword(1) | O/E converter |
Keyword(2) | UTP cable |
Keyword(3) | USB memory |
1st Author's Name | Keniti YANO |
1st Author's Affiliation | Kyushu Institute Technology() |
2nd Author's Name | Nobuo KUWABARA |
2nd Author's Affiliation | Kyushu Institute Technology |
3rd Author's Name | Toshiki SHIMAMAKI |
3rd Author's Affiliation | NEC Engineering, Ltd |
4th Author's Name | Hidenori MURAMATSU |
4th Author's Affiliation | VCCI Council |
5th Author's Name | Kengo MORI |
5th Author's Affiliation | I-O DATA DEVIC |
Date | 2013-01-10 |
Paper # | EMCJ2012-113 |
Volume (vol) | vol.112 |
Number (no) | 372 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |