Presentation | 2013/3/6 A Trial for Reliability Hot spot Visualization for Large-scale Integrated Circuits KATSUYA KINOSHITA, TOMOHIKO SUMI, TAMOTSU ISHIHARA, LIE LIN, MASAHIRO FUKUI, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | In recent large-scale integrated circuit, hot spot for reliability becomes a complicated function. This paper has visualized the risks by noise of power gating, rising time, power consumption, timing, etc. The visualization system is built by Windows PC and the dangerous place is high-lighted by the multi-layered visualization system. This display system has high flexibility. We have checked that it can be used as a base of future "visualization" system. |
Keyword(in Japanese) | (See Japanese page) |
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Paper # | Vol.2013-SLDM-160 No.18,Vol.2013-EMB-28 No.18 |
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Committee | DC |
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Conference Date | 2013/3/6(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Registration To | Dependable Computing (DC) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A Trial for Reliability Hot spot Visualization for Large-scale Integrated Circuits |
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1st Author's Name | KATSUYA KINOSHITA |
1st Author's Affiliation | Ritsumeikan University() |
2nd Author's Name | TOMOHIKO SUMI |
2nd Author's Affiliation | Graduate School of Ritsumeikan University |
3rd Author's Name | TAMOTSU ISHIHARA |
3rd Author's Affiliation | Graduate School of Ritsumeikan University |
4th Author's Name | LIE LIN |
4th Author's Affiliation | Graduate School of Ritsumeikan University |
5th Author's Name | MASAHIRO FUKUI |
5th Author's Affiliation | Graduate School of Ritsumeikan University |
Date | 2013/3/6 |
Paper # | Vol.2013-SLDM-160 No.18,Vol.2013-EMB-28 No.18 |
Volume (vol) | vol.112 |
Number (no) | 482 |
Page | pp.pp.- |
#Pages | 6 |
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