| Presentation | 2013/3/6 Trial of the Easiness improvement for Reviewer Detecting Defect by Viewpoint of Test YUTAKA HADA, YASUYUKI ISHIYAMA, NORIYUKI AOKI, |
|---|---|
| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Design Review in the upper process and Test in the lower process are typical detective activity about software development. To improve the quality of Design Review, we changed tacit knowledge into explicit knowledge as Test point of view tree. In this way, we detected undetectable defects before in Design Review. In addition, we used it for some projects repeatedly and confirmed the education effect on development team. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | |
| Paper # | Vol.2013-SLDM-160 No.12,Vol.2013-EMB-28 No.12 |
| Date of Issue |
| Conference Information | |
| Committee | DC |
|---|---|
| Conference Date | 2013/3/6(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Dependable Computing (DC) |
|---|---|
| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Trial of the Easiness improvement for Reviewer Detecting Defect by Viewpoint of Test |
| Sub Title (in English) | |
| Keyword(1) | |
| 1st Author's Name | YUTAKA HADA |
| 1st Author's Affiliation | NEC Communication Systems, Ltd.() |
| 2nd Author's Name | YASUYUKI ISHIYAMA |
| 2nd Author's Affiliation | NEC Communication Systems, Ltd. |
| 3rd Author's Name | NORIYUKI AOKI |
| 3rd Author's Affiliation | NEC Communication Systems, Ltd. |
| Date | 2013/3/6 |
| Paper # | Vol.2013-SLDM-160 No.12,Vol.2013-EMB-28 No.12 |
| Volume (vol) | vol.112 |
| Number (no) | 482 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |