Presentation 2013/3/6
Memory Protection Test for Memory-Protected RTOS
YOSHIYUKI KAZAMA, NAOKI SAKUDO, KEI DAN, AMI KIDOWAKI, WATARU HIRAHASHI, KAZUTO SHIGIHARA, TOMOAKI UNAGAMI, SHINYA HONDA, HIROAKI TAKADA,
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Abstract(in English) Needs for RTOS memory protection is growing due to recent trends in largescale, and high functional software. As RTOS compromises the core of software architecture, RTOS engineers are often faced with high levels of quality requirements. Despite the high and complicated requirements, not much has been clarified about the test process and method, or the test scale for memory protection. By adopting a new test method for AUTOSAR specification based RTOS, the present paper introduced the test process for memory protection. test method, as well as the effectiveness of the test procedure.
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Paper # Vol.2013-SLDM-160 No.2,Vol.2013-EMB-28 No.2
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Conference Date 2013/3/6(1days)
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Language JPN
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Title (in English) Memory Protection Test for Memory-Protected RTOS
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1st Author's Name YOSHIYUKI KAZAMA
1st Author's Affiliation NEC Communication Systems, Ltd.()
2nd Author's Name NAOKI SAKUDO
2nd Author's Affiliation Sunny Giken Inc.
3rd Author's Name KEI DAN
3rd Author's Affiliation FUJISOFT INCORPORATED
4th Author's Name AMI KIDOWAKI
4th Author's Affiliation FUJISOFT INCORPORATED
5th Author's Name WATARU HIRAHASHI
5th Author's Affiliation Nagoya University
6th Author's Name KAZUTO SHIGIHARA
6th Author's Affiliation Nagoya University
7th Author's Name TOMOAKI UNAGAMI
7th Author's Affiliation Nagoya University
8th Author's Name SHINYA HONDA
8th Author's Affiliation Nagoya University
9th Author's Name HIROAKI TAKADA
9th Author's Affiliation Nagoya University
Date 2013/3/6
Paper # Vol.2013-SLDM-160 No.2,Vol.2013-EMB-28 No.2
Volume (vol) vol.112
Number (no) 482
Page pp.pp.-
#Pages 6
Date of Issue