Presentation | 2013-03-14 Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism : Modeling about Fluctuation of Contact Resistance (3) Shin-ichi WADA, Keiji KOSHIDA, Hiroaki KUBOTA, Koichiro SAWA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Authors have developed some mechanisms which give real vibration to electrical contacts and studied the influences of a micro-oscillating on the contact resistance. By using the mechanism, "Micro-Sliding Mechanism II", which was developed on trial, they obtained time-sequential fluctuation data of contact voltage. It was shown that there are quasi-stable and periodic closed orbits and bifurcation phenomenon in the data by using phase plane analysis. It was indicated that the data are able to be simulated by large and small artificial rectangular wave. It was also shown that there are stable and periodic closed orbits and bifurcation phenomenon similar to the above in the artificial data by using phase plane analysis and that there are different phenomena from the above. It was suggested that there is necessary to consider the non-linearity in the system for analyzing the difiference caused the fluctuation of amplitudes or frequencies and data jumping although the phenomena depend upon the non-linearity of the inputs into the system. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | electrical contact / micro-oscillation / contact resistance / micro-sliding mechanism / non-linearity / phase plane analysis / orbit / bifurcation |
Paper # | NLP2012-152 |
Date of Issue |
Conference Information | |
Committee | NLP |
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Conference Date | 2013/3/7(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Nonlinear Problems (NLP) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism : Modeling about Fluctuation of Contact Resistance (3) |
Sub Title (in English) | |
Keyword(1) | electrical contact |
Keyword(2) | micro-oscillation |
Keyword(3) | contact resistance |
Keyword(4) | micro-sliding mechanism |
Keyword(5) | non-linearity |
Keyword(6) | phase plane analysis |
Keyword(7) | orbit |
Keyword(8) | bifurcation |
1st Author's Name | Shin-ichi WADA |
1st Author's Affiliation | TMC System Co. Ltd.() |
2nd Author's Name | Keiji KOSHIDA |
2nd Author's Affiliation | TMC System Co. Ltd. |
3rd Author's Name | Hiroaki KUBOTA |
3rd Author's Affiliation | TMC System Co. Ltd. |
4th Author's Name | Koichiro SAWA |
4th Author's Affiliation | Keio University:Nippon Institute of Thechnology |
Date | 2013-03-14 |
Paper # | NLP2012-152 |
Volume (vol) | vol.112 |
Number (no) | 487 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |