| Presentation | 2012-12-14 A Test Generation Model for Over-testing Alleviation and Its Application to Testing Based on Fault Acceptability Masaaki SAKURADA, Hideyuki ICHIHARA, Tsuyoshi IWAGAKI, Tomoo INOUE, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Over-testing, which is to judge fault-free chips as faulty ones, is a cause of the decrease in the effective yield of chips. In this paper, we propose a test generation model, called selective test generation model, in order to alleviate over-testing. Using this model with a general test generation algorithm can generate test patterns that not only detect target faults but also do not detect faults to be avoided being detected. Moreover, we discuss an application of this model to testing based on fault acceptability, which is defied according to error rate. We formulate two test generation problems for acceptable faults and give an approximate algorithm employing the proposed model to solve one of them. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Over-testing / acceptable faults / test generation / error rate / transformation / test generation model |
| Paper # | DC2012-77 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2012/12/7(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Test Generation Model for Over-testing Alleviation and Its Application to Testing Based on Fault Acceptability |
| Sub Title (in English) | |
| Keyword(1) | Over-testing |
| Keyword(2) | acceptable faults |
| Keyword(3) | test generation |
| Keyword(4) | error rate |
| Keyword(5) | transformation |
| Keyword(6) | test generation model |
| 1st Author's Name | Masaaki SAKURADA |
| 1st Author's Affiliation | Graduate School of Information Sciences Hiroshima City University() |
| 2nd Author's Name | Hideyuki ICHIHARA |
| 2nd Author's Affiliation | Graduate School of Information Sciences Hiroshima City University |
| 3rd Author's Name | Tsuyoshi IWAGAKI |
| 3rd Author's Affiliation | Graduate School of Information Sciences Hiroshima City University |
| 4th Author's Name | Tomoo INOUE |
| 4th Author's Affiliation | Graduate School of Information Sciences Hiroshima City University |
| Date | 2012-12-14 |
| Paper # | DC2012-77 |
| Volume (vol) | vol.112 |
| Number (no) | 362 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |