| Presentation | 2012-12-21 Degradation Phenomenon of Electrical Contacts using hammering oscillating mechanism and micro-sliding mechanism : A fundamental study on the performance of the hammering oscillating mechanism (26) Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Naoki Masuda, Kunio Yanagi, Hiroaki Kubota, Masashi Terasaki, Koichiro Sawa, |
|---|---|
| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Authors have studied the influence on electrical contacts by actual micro-oscillation using some oscillating mechanisms (Hammering Oscillating Mechanism, Micro-Sliding Mechanism, Tapping Device etc.). In this paper, first, the authors compare cyclic metal ball drop test with hammering oscillating mechanism on the performance of acceleration and force for the hammered object, and show that the distribution of the data by the latter is much smaller than the former. Second, they propose a simple and practical protocol to estimate an effective mass, effective force and effective acceleration of the electrical devices on the PCB (printed circuit board) using hammering oscillating mechanism. Third, they discuss the degradation mechanism on electrical contacts under the influence of micro-oscillation from the effective force and the frictional force, and indicate the correlation between the former and the latter. Finally, they estimate the damping ratio and natural frequency of the system on the assumption that there is transient response characteristic with impulsive concentric load in the effective acceleration. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | electrical contact / micro-oscillation / contact resistance / hammering oscillating mechanism / frictional force / effective mass / effective force / effective acceleration |
| Paper # | EMD2012-95 |
| Date of Issue |
| Conference Information | |
| Committee | EMD |
|---|---|
| Conference Date | 2012/12/14(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Electromechanical Devices (EMD) |
|---|---|
| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Degradation Phenomenon of Electrical Contacts using hammering oscillating mechanism and micro-sliding mechanism : A fundamental study on the performance of the hammering oscillating mechanism (26) |
| Sub Title (in English) | |
| Keyword(1) | electrical contact |
| Keyword(2) | micro-oscillation |
| Keyword(3) | contact resistance |
| Keyword(4) | hammering oscillating mechanism |
| Keyword(5) | frictional force |
| Keyword(6) | effective mass |
| Keyword(7) | effective force |
| Keyword(8) | effective acceleration |
| 1st Author's Name | Shin-ichi Wada |
| 1st Author's Affiliation | TMC System Co. Ltd.() |
| 2nd Author's Name | Keiji Koshida |
| 2nd Author's Affiliation | TMC System Co. Ltd. |
| 3rd Author's Name | Saindaa Norovling |
| 3rd Author's Affiliation | TMC System Co. Ltd. |
| 4th Author's Name | Naoki Masuda |
| 4th Author's Affiliation | Tokyo National College of Technology |
| 5th Author's Name | Kunio Yanagi |
| 5th Author's Affiliation | TMC System Co. Ltd. |
| 6th Author's Name | Hiroaki Kubota |
| 6th Author's Affiliation | TMC System Co. Ltd. |
| 7th Author's Name | Masashi Terasaki |
| 7th Author's Affiliation | Tokyo National College of Technology |
| 8th Author's Name | Koichiro Sawa |
| 8th Author's Affiliation | Nippon Institute of Technology |
| Date | 2012-12-21 |
| Paper # | EMD2012-95 |
| Volume (vol) | vol.112 |
| Number (no) | 370 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |