| Presentation | 2012-11-21 How to Extract AES Key from Smart Card by Fault Injection Attack Using Electromagnetic Irradiation Yuu TSUCHIYA, Takeshi KISHIKAWA, Shohei SAITO, Tsuyoshi TOYAMA, Akihiko SASAKI, Akashi SATOH, Tsutomu MATSUMOTO, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Fault injection attack, inducing partial fault in a cryptographic module and extracting the inside key, has been considered to be a security threat, and there is a need to develop a method to evaluate the security of cryptographic modules against the fault attack. In our research, we have developed an experiment environment for fault injection attack using electromagnetic irradiation to evaluate the security of cryptographic modules. This environment irradiates electromagnetic wave to a smartcard with software-implemented AES. We have succeeded in inducing a fault in each clock of the AddRoundKey process. As a result, we have extracted the whole 10th round key of AES by a simple operation or directly, from faulty and correct ciphertexts. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Smart Card / MPU / Fault Injection Attack / Electromagnetic Wave / AES / DFA / Cryptography |
| Paper # | ISEC2012-57,LOIS2012-32 |
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| Conference Information | |
| Committee | LOIS |
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| Conference Date | 2012/11/14(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Life Intelligence and Office Information Systems (LOIS) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | How to Extract AES Key from Smart Card by Fault Injection Attack Using Electromagnetic Irradiation |
| Sub Title (in English) | |
| Keyword(1) | Smart Card |
| Keyword(2) | MPU |
| Keyword(3) | Fault Injection Attack |
| Keyword(4) | Electromagnetic Wave |
| Keyword(5) | AES |
| Keyword(6) | DFA |
| Keyword(7) | Cryptography |
| 1st Author's Name | Yuu TSUCHIYA |
| 1st Author's Affiliation | Graduate School of Environment and Information Sciences, Yokohama National University() |
| 2nd Author's Name | Takeshi KISHIKAWA |
| 2nd Author's Affiliation | Graduate School of Environment and Information Sciences, Yokohama National University |
| 3rd Author's Name | Shohei SAITO |
| 3rd Author's Affiliation | Graduate School of Environment and Information Sciences, Yokohama National University |
| 4th Author's Name | Tsuyoshi TOYAMA |
| 4th Author's Affiliation | Graduate School of Environment and Information Sciences, Yokohama National University |
| 5th Author's Name | Akihiko SASAKI |
| 5th Author's Affiliation | Morita-tech Co., Ltd. |
| 6th Author's Name | Akashi SATOH |
| 6th Author's Affiliation | VLSI Design and Education Center, The University of Tokyo |
| 7th Author's Name | Tsutomu MATSUMOTO |
| 7th Author's Affiliation | Graduate School of Environment and Information Sciences, Yokohama National University |
| Date | 2012-11-21 |
| Paper # | ISEC2012-57,LOIS2012-32 |
| Volume (vol) | vol.112 |
| Number (no) | 306 |
| Page | pp.pp.- |
| #Pages | 8 |
| Date of Issue | |