Presentation 2012-11-21
How to Extract AES Key from Smart Card by Fault Injection Attack Using Electromagnetic Irradiation
Yuu TSUCHIYA, Takeshi KISHIKAWA, Shohei SAITO, Tsuyoshi TOYAMA, Akihiko SASAKI, Akashi SATOH, Tsutomu MATSUMOTO,
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Abstract(in English) Fault injection attack, inducing partial fault in a cryptographic module and extracting the inside key, has been considered to be a security threat, and there is a need to develop a method to evaluate the security of cryptographic modules against the fault attack. In our research, we have developed an experiment environment for fault injection attack using electromagnetic irradiation to evaluate the security of cryptographic modules. This environment irradiates electromagnetic wave to a smartcard with software-implemented AES. We have succeeded in inducing a fault in each clock of the AddRoundKey process. As a result, we have extracted the whole 10th round key of AES by a simple operation or directly, from faulty and correct ciphertexts.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Smart Card / MPU / Fault Injection Attack / Electromagnetic Wave / AES / DFA / Cryptography
Paper # ISEC2012-57,LOIS2012-32
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Committee LOIS
Conference Date 2012/11/14(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) How to Extract AES Key from Smart Card by Fault Injection Attack Using Electromagnetic Irradiation
Sub Title (in English)
Keyword(1) Smart Card
Keyword(2) MPU
Keyword(3) Fault Injection Attack
Keyword(4) Electromagnetic Wave
Keyword(5) AES
Keyword(6) DFA
Keyword(7) Cryptography
1st Author's Name Yuu TSUCHIYA
1st Author's Affiliation Graduate School of Environment and Information Sciences, Yokohama National University()
2nd Author's Name Takeshi KISHIKAWA
2nd Author's Affiliation Graduate School of Environment and Information Sciences, Yokohama National University
3rd Author's Name Shohei SAITO
3rd Author's Affiliation Graduate School of Environment and Information Sciences, Yokohama National University
4th Author's Name Tsuyoshi TOYAMA
4th Author's Affiliation Graduate School of Environment and Information Sciences, Yokohama National University
5th Author's Name Akihiko SASAKI
5th Author's Affiliation Morita-tech Co., Ltd.
6th Author's Name Akashi SATOH
6th Author's Affiliation VLSI Design and Education Center, The University of Tokyo
7th Author's Name Tsutomu MATSUMOTO
7th Author's Affiliation Graduate School of Environment and Information Sciences, Yokohama National University
Date 2012-11-21
Paper # ISEC2012-57,LOIS2012-32
Volume (vol) vol.112
Number (no) 306
Page pp.pp.-
#Pages 8
Date of Issue