| Presentation | 2012-11-28 A Study on Test Generation for Effective Test Compaction Yukino KUSUYAMA, Tatsuya YAMAZAKI, Toshinori HOSOKAWA, Masayoshi YOSHIMURA, Kouji YAMAZAKI, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In recent year, the numbers of target fault models and faults for testing increase because the number of gates on VLSIs is increasing and their complexity is growing with advances in semiconductor technology. As the result, the number of test patterns drastically increases. Many test compaction methods have been proposed to reduce the number of test patterns maintaining fault coverage. In this paper, we propose a dynamic test compaction method in which double detection, don't care identification, and test pattern merge techniques are applied to a test set in a compaction buffer. We also propose a primary fault selection using influence cones for test generation to generate test patterns for faults which are predicted to be detected by test patterns with many care bits in an early stage. Experimental results for some small circuits of ISCAS'89 benchmark circuits show that the numbers of generated test patterns by our proposed methods are the almost same as the minimal numbers of test patterns. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | test compaction in a compaction buffer / influence cones for test generation / double detection / don't care identification / fault selection |
| Paper # | VLD2012-105,DC2012-71 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2012/11/19(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Study on Test Generation for Effective Test Compaction |
| Sub Title (in English) | |
| Keyword(1) | test compaction in a compaction buffer |
| Keyword(2) | influence cones for test generation |
| Keyword(3) | double detection |
| Keyword(4) | don't care identification |
| Keyword(5) | fault selection |
| 1st Author's Name | Yukino KUSUYAMA |
| 1st Author's Affiliation | Graduate School of Industrial Technology, Nihon University() |
| 2nd Author's Name | Tatsuya YAMAZAKI |
| 2nd Author's Affiliation | Graduate School of Industrial Technology, Nihon University |
| 3rd Author's Name | Toshinori HOSOKAWA |
| 3rd Author's Affiliation | College of Industrial Technology, Nihon University |
| 4th Author's Name | Masayoshi YOSHIMURA |
| 4th Author's Affiliation | Graduate School of Infomation Science and Electrical Engineering, Kyushu University |
| 5th Author's Name | Kouji YAMAZAKI |
| 5th Author's Affiliation | School of Information and Communication, Meiji University |
| Date | 2012-11-28 |
| Paper # | VLD2012-105,DC2012-71 |
| Volume (vol) | vol.112 |
| Number (no) | 321 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |