| Presentation | 2012-11-28 Design of temperature and voltage monitoring circuit structure for field test Wataru TSUMORI, Yousuke MIYAKE, Yasuo SATO, Seiji KAJIHARA, Yukiya MIURA, |
|---|---|
| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | For improving reliability of LSIs, the delay increase caused by aging during system operation should be detected before a system failure occurs. Such a delay increase can be detected by repeatedly measuring a circuit delay in field. However, the measured delay tends to vary a lot depending on temperature and voltage variations, therefore, it is necessary to get an accurate delay increase without these variations. A method has been proposed that estimates temperature and voltage from the frequencies of the multiple ring-oscillators on a chip. This paper tries to find the best configuration of the ring-oscillators in order to improve its estimation accuracy. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Delay measurement / Aging / Field test / Temperature and Voltage monitor / Ring-Oscillator |
| Paper # | VLD2012-101,DC2012-67 |
| Date of Issue |
| Conference Information | |
| Committee | DC |
|---|---|
| Conference Date | 2012/11/19(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Dependable Computing (DC) |
|---|---|
| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Design of temperature and voltage monitoring circuit structure for field test |
| Sub Title (in English) | |
| Keyword(1) | Delay measurement |
| Keyword(2) | Aging |
| Keyword(3) | Field test |
| Keyword(4) | Temperature and Voltage monitor |
| Keyword(5) | Ring-Oscillator |
| 1st Author's Name | Wataru TSUMORI |
| 1st Author's Affiliation | Kyushu Institute of Technology:Japan Science and Technology Agency, CREST() |
| 2nd Author's Name | Yousuke MIYAKE |
| 2nd Author's Affiliation | Kyushu Institute of Technology:Japan Science and Technology Agency, CREST |
| 3rd Author's Name | Yasuo SATO |
| 3rd Author's Affiliation | Kyushu Institute of Technology:Japan Science and Technology Agency, CREST |
| 4th Author's Name | Seiji KAJIHARA |
| 4th Author's Affiliation | Kyushu Institute of Technology:Japan Science and Technology Agency, CREST |
| 5th Author's Name | Yukiya MIURA |
| 5th Author's Affiliation | Tokyo Metropolitan Univ:Japan Science and Technology Agency, CREST |
| Date | 2012-11-28 |
| Paper # | VLD2012-101,DC2012-67 |
| Volume (vol) | vol.112 |
| Number (no) | 321 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |