Presentation | 2012-11-28 Control of Fine-Grain Power Gating by Detecting of the Virtual Ground Voltage Masaru KUDO, Kimiyoshi USAMI, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | This paper describes fine-grain control to power gate function units using the charge up phenomenon of the virtual ground voltage by the leak current. This scheme reduces leakage power more effectively, because changing delay time by quantity of leak current. It has reduced the energy by 83% on average. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Fine Grain Power Gating / Leak Monitor / Low Power |
Paper # | VLD2012-98,DC2012-64 |
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Conference Information | |
Committee | DC |
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Conference Date | 2012/11/19(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Dependable Computing (DC) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Control of Fine-Grain Power Gating by Detecting of the Virtual Ground Voltage |
Sub Title (in English) | |
Keyword(1) | Fine Grain Power Gating |
Keyword(2) | Leak Monitor |
Keyword(3) | Low Power |
1st Author's Name | Masaru KUDO |
1st Author's Affiliation | Department of Information Science and Engineering, Shibaura Institute of Technology() |
2nd Author's Name | Kimiyoshi USAMI |
2nd Author's Affiliation | Department of Information Engineering, Shibaura Institute of Technology |
Date | 2012-11-28 |
Paper # | VLD2012-98,DC2012-64 |
Volume (vol) | vol.112 |
Number (no) | 321 |
Page | pp.pp.- |
#Pages | 6 |
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