Presentation 2012-11-28
A LSI-Package-Board co-evaluation of Power noise in the Digtal LSI
Kumpei YOSHIKAWA, Yuta SASAKI, Kouji ICHIKAWA, Yoshiyuki SAITO, Makoto NAGATA,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Problems related with power noise in LSI system are getting prominent because of the higher integration and lower V_
voltage of an LSI chip. A Power noise simulation method that could use in various design phases is required for designing noise-tolerant and low-cost systems. The impedance profile of power delivery network (PDN) and circuit operations strongly affects the power noise characteristics. The simulation model that contains whole elements of system such as LSIs, packages, and boards is required. In this paper, we present the LSI-package-board combined power noise simulation model. Accuracy of the simulation model is confirmed by comparing the on-chip noise meaurement results using an on-chip noise monitor circuit and on-board noise measurement results using a magnetic probe method.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Power noise / Power integrity / EMC / Noise simulation
Paper # VLD2012-91,DC2012-57
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Committee DC
Conference Date 2012/11/19(1days)
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Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A LSI-Package-Board co-evaluation of Power noise in the Digtal LSI
Sub Title (in English)
Keyword(1) Power noise
Keyword(2) Power integrity
Keyword(3) EMC
Keyword(4) Noise simulation
1st Author's Name Kumpei YOSHIKAWA
1st Author's Affiliation Graduate School of System Informatics, Kobe University()
2nd Author's Name Yuta SASAKI
2nd Author's Affiliation Graduate School of System Informatics, Kobe University
3rd Author's Name Kouji ICHIKAWA
3rd Author's Affiliation DENSO CORPORATION
4th Author's Name Yoshiyuki SAITO
4th Author's Affiliation Panasonic corporation
5th Author's Name Makoto NAGATA
5th Author's Affiliation Graduate School of System Informatics, Kobe University:JST, CREST
Date 2012-11-28
Paper # VLD2012-91,DC2012-57
Volume (vol) vol.112
Number (no) 321
Page pp.pp.-
#Pages 6
Date of Issue