| Presentation | 2012-11-26 Variations and BTI-induced Aging Degradation on Commercial FPGAs Shouhei ISHII, Kazutoshi KOBAYASHI, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In this paper, we focus on problems concerning variations and degradation on FPGAs which has become dominant due to scaling and quantitatively estimate the degradation of FPGAs by BTI. We show the relationship between variation and degradation. To measure degradation of 90nm and 60nm FPGAs, we map ring oscillators on FPGAs and measure standard deviation of oscillation frequency. As for degradation of FPGAs, we measure variations of oscillation frequency for 30,000 seconds at the room temperature (25℃) or 80℃. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | BTI / FPGA / Variation / Degradation |
| Paper # | VLD2012-72,DC2012-38 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2012/11/19(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Variations and BTI-induced Aging Degradation on Commercial FPGAs |
| Sub Title (in English) | |
| Keyword(1) | BTI |
| Keyword(2) | FPGA |
| Keyword(3) | Variation |
| Keyword(4) | Degradation |
| 1st Author's Name | Shouhei ISHII |
| 1st Author's Affiliation | Graduate School of Science & Technology, Kyoto Institute of Technology() |
| 2nd Author's Name | Kazutoshi KOBAYASHI |
| 2nd Author's Affiliation | Graduate School of Science & Technology, Kyoto Institute of Technology:JST, CREST |
| Date | 2012-11-26 |
| Paper # | VLD2012-72,DC2012-38 |
| Volume (vol) | vol.112 |
| Number (no) | 321 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |