| 講演名 | 2012-11-30 Observation of growth of arc damages on Ag and AgSnO_2 contact surfaces during switching operations , |
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| 抄録(和) | |
| 抄録(英) | An evaluation system for contact surface damages is being constructed so as to realize observation of a changing process of contact surface damages (especially, growth of a crater and/or a pip) during switching operations. This system employs an optical cross-section method for evaluating a cathode surface and further utilizes another camera system for observation of a counterpart anode surface. In this paper, Ag and AgSnO_2 contacts were operated to break a DC inductive 14V-2A load current for 50,000 operations and during the switching operations, changes in a surface profile of the movable cathode electrode (a crater growth process), as well as a surface of the counterpart stationary anode electrode (a pip growth process), was observed at every 2000 operations with this evaluation system. Certain changes in both electrode surfaces were able to be observed during the switching operations. Comparisons of the results for these two contact materials indicate certain differences in material transfer and erosion characteristics among these contact materials. |
| キーワード(和) | |
| キーワード(英) | Optical cross-section method / Electrical contacts / Arc discharge / Crater shape / Material transfer / Erosion |
| 資料番号 | EMD2012-69 |
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| 研究会情報 | |
| 研究会 | EMD |
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| 開催期間 | 2012/11/23(から1日開催) |
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| 申込み研究会 | Electromechanical Devices (EMD) |
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| 本文の言語 | ENG |
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| タイトル（英） | Observation of growth of arc damages on Ag and AgSnO_2 contact surfaces during switching operations |
| サブタイトル（和） | |
| キーワード(1)（和/英） | / Optical cross-section method |
| 第 1 著者 氏名（和/英） | / Keisuke TAKAHASHI |
| 第 1 著者 所属（和/英） | Chitose Institute of Science & Technology |
| 発表年月日 | 2012-11-30 |
| 資料番号 | EMD2012-69 |
| 巻番号（vol） | vol.112 |
| 号番号（no） | 332 |
| ページ範囲 | pp.- |
| ページ数 | 6 |
| 発行日 | |