Presentation 2012-11-15
Neutral and Attractive Traps in Random Telegraph Signal Noise Phenomena using (100)- and (110)-Orientated CMOSFETs
J. Chen, I. Hirano, K. Tatsumura, Y. Mitani,
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Paper # SDM2012-103
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Committee SDM
Conference Date 2012/11/8(1days)
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Registration To Silicon Device and Materials (SDM)
Language JPN
Title (in Japanese) (See Japanese page)
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Title (in English) Neutral and Attractive Traps in Random Telegraph Signal Noise Phenomena using (100)- and (110)-Orientated CMOSFETs
Sub Title (in English)
Keyword(1)
1st Author's Name J. Chen
1st Author's Affiliation Advanced LSI Technology Laboratory, Corporate Research & Development Center, Toshiba Corporation()
2nd Author's Name I. Hirano
2nd Author's Affiliation Advanced LSI Technology Laboratory, Corporate Research & Development Center, Toshiba Corporation
3rd Author's Name K. Tatsumura
3rd Author's Affiliation Advanced LSI Technology Laboratory, Corporate Research & Development Center, Toshiba Corporation
4th Author's Name Y. Mitani
4th Author's Affiliation Advanced LSI Technology Laboratory, Corporate Research & Development Center, Toshiba Corporation
Date 2012-11-15
Paper # SDM2012-103
Volume (vol) vol.112
Number (no) 290
Page pp.pp.-
#Pages 4
Date of Issue