Presentation | 2012-11-15 Neutral and Attractive Traps in Random Telegraph Signal Noise Phenomena using (100)- and (110)-Orientated CMOSFETs J. Chen, I. Hirano, K. Tatsumura, Y. Mitani, |
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Abstract(in Japanese) | (See Japanese page) |
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Paper # | SDM2012-103 |
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Committee | SDM |
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Conference Date | 2012/11/8(1days) |
Place (in Japanese) | (See Japanese page) |
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Registration To | Silicon Device and Materials (SDM) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Neutral and Attractive Traps in Random Telegraph Signal Noise Phenomena using (100)- and (110)-Orientated CMOSFETs |
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1st Author's Name | J. Chen |
1st Author's Affiliation | Advanced LSI Technology Laboratory, Corporate Research & Development Center, Toshiba Corporation() |
2nd Author's Name | I. Hirano |
2nd Author's Affiliation | Advanced LSI Technology Laboratory, Corporate Research & Development Center, Toshiba Corporation |
3rd Author's Name | K. Tatsumura |
3rd Author's Affiliation | Advanced LSI Technology Laboratory, Corporate Research & Development Center, Toshiba Corporation |
4th Author's Name | Y. Mitani |
4th Author's Affiliation | Advanced LSI Technology Laboratory, Corporate Research & Development Center, Toshiba Corporation |
Date | 2012-11-15 |
Paper # | SDM2012-103 |
Volume (vol) | vol.112 |
Number (no) | 290 |
Page | pp.pp.- |
#Pages | 4 |
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