Presentation 2012-11-29
Effect of Passivation on Drain Current Dispersion for AlGaN/GaN HEMTs
Md. Tanvir HASAN, Hirokuni TOKUDA, Masaaki KUZUHARA,
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Abstract(in English) AlGaN/GaN HEMTs with different passivation layers were studied using pulsed I-V system. The maximum drain current showed higher values at pulsed conditions as compared with DC for SiN passivation, and vice versa for Al_2O_3, SiO_2 and without passivation. The drain current decreased with increasing the on-state time for SiN, which indicated that the most probable location of trap was at the AlGaN layer beneath the gate. Increasing tendency of drain current with increasing on-state time indicated that the surface traps were dominant for this behavior, which was the case for Al_2O_3, SiO_2, and without passivation.
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Keyword(in English) AlGaN/GaN HEMTs / current dispersion / passivation / pulsed IV system
Paper # ED2012-76,CPM2012-133,LQE2012-104
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Committee ED
Conference Date 2012/11/22(1days)
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Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Effect of Passivation on Drain Current Dispersion for AlGaN/GaN HEMTs
Sub Title (in English)
Keyword(1) AlGaN/GaN HEMTs
Keyword(2) current dispersion
Keyword(3) passivation
Keyword(4) pulsed IV system
1st Author's Name Md. Tanvir HASAN
1st Author's Affiliation Graduate School of Engineering, University of Fukui()
2nd Author's Name Hirokuni TOKUDA
2nd Author's Affiliation Graduate School of Engineering, University of Fukui
3rd Author's Name Masaaki KUZUHARA
3rd Author's Affiliation Graduate School of Engineering, University of Fukui
Date 2012-11-29
Paper # ED2012-76,CPM2012-133,LQE2012-104
Volume (vol) vol.112
Number (no) 327
Page pp.pp.-
#Pages 6
Date of Issue