Presentation 2012-11-19
Fabrication of Graphene Edge Emitters and Their Field Emission Properties
Katsuhisa MURAKAMI, Hisato YAMAGUCHI, Fujio WAKAYA, Mikio Takai, Manish CHHOWALLA,
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Abstract(in English) The electron emission properties of thin edges of reduced graphene oxide (rGO) were investigated by field emission microscopy (FEM) and in-situ field ion microscopy (FIM). The electron emission patterns of thin rGO edge consisted of alternating bright and dark fringe bands in the FEM image. The FIM image showed the array of bright spots along the FEM patterns. These results suggested that the field emission occurs at the atomically thin edges of rGO.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Graphene / Field Emission
Paper # ED2012-55
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Committee ED
Conference Date 2012/11/12(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
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Title (in English) Fabrication of Graphene Edge Emitters and Their Field Emission Properties
Sub Title (in English)
Keyword(1) Graphene
Keyword(2) Field Emission
1st Author's Name Katsuhisa MURAKAMI
1st Author's Affiliation Institute of Applied Physics, University of Tsukuba:Tsukuba Research Center for Interdisciplinary Materials Science, University of Tsukuba()
2nd Author's Name Hisato YAMAGUCHI
2nd Author's Affiliation Department of Materials Science and Engineering, Rutgers University, United States
3rd Author's Name Fujio WAKAYA
3rd Author's Affiliation Center for Quantum Science and Technology under Extreme Conditions, Osaka University
4th Author's Name Mikio Takai
4th Author's Affiliation Center for Quantum Science and Technology under Extreme Conditions, Osaka University
5th Author's Name Manish CHHOWALLA
5th Author's Affiliation Department of Materials Science and Engineering, Rutgers University, United States
Date 2012-11-19
Paper # ED2012-55
Volume (vol) vol.112
Number (no) 303
Page pp.pp.-
#Pages 4
Date of Issue