Presentation | 2012-11-19 Fabrication of Graphene Edge Emitters and Their Field Emission Properties Katsuhisa MURAKAMI, Hisato YAMAGUCHI, Fujio WAKAYA, Mikio Takai, Manish CHHOWALLA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | The electron emission properties of thin edges of reduced graphene oxide (rGO) were investigated by field emission microscopy (FEM) and in-situ field ion microscopy (FIM). The electron emission patterns of thin rGO edge consisted of alternating bright and dark fringe bands in the FEM image. The FIM image showed the array of bright spots along the FEM patterns. These results suggested that the field emission occurs at the atomically thin edges of rGO. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Graphene / Field Emission |
Paper # | ED2012-55 |
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Committee | ED |
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Conference Date | 2012/11/12(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Electron Devices (ED) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Fabrication of Graphene Edge Emitters and Their Field Emission Properties |
Sub Title (in English) | |
Keyword(1) | Graphene |
Keyword(2) | Field Emission |
1st Author's Name | Katsuhisa MURAKAMI |
1st Author's Affiliation | Institute of Applied Physics, University of Tsukuba:Tsukuba Research Center for Interdisciplinary Materials Science, University of Tsukuba() |
2nd Author's Name | Hisato YAMAGUCHI |
2nd Author's Affiliation | Department of Materials Science and Engineering, Rutgers University, United States |
3rd Author's Name | Fujio WAKAYA |
3rd Author's Affiliation | Center for Quantum Science and Technology under Extreme Conditions, Osaka University |
4th Author's Name | Mikio Takai |
4th Author's Affiliation | Center for Quantum Science and Technology under Extreme Conditions, Osaka University |
5th Author's Name | Manish CHHOWALLA |
5th Author's Affiliation | Department of Materials Science and Engineering, Rutgers University, United States |
Date | 2012-11-19 |
Paper # | ED2012-55 |
Volume (vol) | vol.112 |
Number (no) | 303 |
Page | pp.pp.- |
#Pages | 4 |
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