Presentation | 2012-11-29 Electrical Properties of Si-Based Heterojunctions by Surface-Activated Bonding Jianbo LIANG, Naoteru SHIGEGAWA, Eiji HIGURASHI, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | The electrical properties of Si/Si, Si/GaN and Si/GaAs junctions fabricated by using surface-activated bonding (SAB) were investigated. Current-voltage (I-V) characteristics of n-Si/n-Si and n-Si/n-GaN junctions indicated ohmic features at room temperature. The I-V characteristics of respective n-Si/n-Si dice were close to one another. No mechanical deficits were observed in n-Si/n-GaN junctions after measurements in varied temperatures. The p-Si/n-GaAs junctions revealed good rectifying properties. Their flat-band voltage was around 1.6V, which is close to the diffusion potential calculated for p-Si/n-GaAs heterojunctions with no electric charges placed at the interface. These results indicate that the SAB is potentially applicable for fabricating novel devices. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Surface-activated bonding / current-voltage characteristics / trap-assisted tunneling / heterojunctions / GaN / GaAs / hybrid tandem solar cell |
Paper # | ED2012-65,CPM2012-122,LQE2012-93 |
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Committee | ED |
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Conference Date | 2012/11/22(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Electron Devices (ED) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Electrical Properties of Si-Based Heterojunctions by Surface-Activated Bonding |
Sub Title (in English) | |
Keyword(1) | Surface-activated bonding |
Keyword(2) | current-voltage characteristics |
Keyword(3) | trap-assisted tunneling |
Keyword(4) | heterojunctions |
Keyword(5) | GaN |
Keyword(6) | GaAs |
Keyword(7) | hybrid tandem solar cell |
1st Author's Name | Jianbo LIANG |
1st Author's Affiliation | Graduate School of Engineering, Osaka City University() |
2nd Author's Name | Naoteru SHIGEGAWA |
2nd Author's Affiliation | Graduate School of Engineering, Osaka City University |
3rd Author's Name | Eiji HIGURASHI |
3rd Author's Affiliation | RCAST, Univ. of Tokyo |
Date | 2012-11-29 |
Paper # | ED2012-65,CPM2012-122,LQE2012-93 |
Volume (vol) | vol.112 |
Number (no) | 327 |
Page | pp.pp.- |
#Pages | 5 |
Date of Issue |