講演名 | 2012-11-27 Accurate I/O Buffer Impedance Self-adjustment using Threshold Voltage and Temperature Sensors , |
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抄録(和) | |
抄録(英) | With the increased operating frequency and the reduction of feature size, achieving low error-rate data transmission between LSIs is an important field of research. In particular, input/output (I/O) impedance matching, as one of the necessary technologies for high-speed transmission, is strongly required. In this paper, we propose an architecture of output buffer whose impedance is self-adjustable against process variation and temperature characteristic of MOS transistors. The proposed architecture utilizes on-chip sensor circuits to capture threshold voltages and temperatures. Based on a commercial 65 nm CMOS technology. The proposed method has been verified. Without the use of reference resistor, it successfully adjusts the I/O impedance within 2.36% and 1.4% around a target of 50Ω through simulation and measurement, respectively, regardless of the process parameters and temperature. |
キーワード(和) | |
キーワード(英) | I/O buffer / self-adjustment / threshold voltage sensor / temperature sensor |
資料番号 | VLD2012-79,DC2012-45 |
発行日 |
研究会情報 | |
研究会 | VLD |
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開催期間 | 2012/11/19(から1日開催) |
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幹事補佐氏名(和) | |
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講演論文情報詳細 | |
申込み研究会 | VLSI Design Technologies (VLD) |
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本文の言語 | ENG |
タイトル(和) | |
サブタイトル(和) | |
タイトル(英) | Accurate I/O Buffer Impedance Self-adjustment using Threshold Voltage and Temperature Sensors |
サブタイトル(和) | |
キーワード(1)(和/英) | / I/O buffer |
第 1 著者 氏名(和/英) | / Zhi LI |
第 1 著者 所属(和/英) | Dept. of Communications and Computer Engineering, Graduate School of Informatics, Kyoto University |
発表年月日 | 2012-11-27 |
資料番号 | VLD2012-79,DC2012-45 |
巻番号(vol) | vol.112 |
号番号(no) | 320 |
ページ範囲 | pp.- |
ページ数 | 6 |
発行日 |