Presentation 2012-11-01
Diagnosis of Stochastic Discrete Event Systems Based On N-gram Models With Wildcard Characters
Kunihiko HIRAISHI, Miwa YOSHIMOTO, Koichi KOBAYASHI,
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Abstract(in English) In a previous paper by the authors, a new scheme for the diagnosis of stochastic discrete event systems is proposed. From the event logs, N-gram models that approximate the behavior of the target system are extracted. N-gram models are used for discovering discrepancy between the observed event logs and the behavior of the system in the normal situation. However, when the target system is a distributed system consisting of several subsystems, event sequences from subsystems may be interleaved and the method cannot separate the event sequence from local event sequences by subsystems. In this paper, we introduce the wildcard character in the short sequences. This contributes to removing the effect by subsystems which may not be related to faults.
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Keyword(in English) Discrete event systems / diagnosis / N-gram model
Paper # CAS2012-55,MSS2012-35
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Conference Date 2012/10/25(1days)
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Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Diagnosis of Stochastic Discrete Event Systems Based On N-gram Models With Wildcard Characters
Sub Title (in English)
Keyword(1) Discrete event systems
Keyword(2) diagnosis
Keyword(3) N-gram model
1st Author's Name Kunihiko HIRAISHI
1st Author's Affiliation School of Information Science, Japan Advanced Institute of Science and Technology()
2nd Author's Name Miwa YOSHIMOTO
2nd Author's Affiliation School of Information Science, Japan Advanced Institute of Science and Technology
3rd Author's Name Koichi KOBAYASHI
3rd Author's Affiliation School of Information Science, Japan Advanced Institute of Science and Technology
Date 2012-11-01
Paper # CAS2012-55,MSS2012-35
Volume (vol) vol.112
Number (no) 274
Page pp.pp.-
#Pages 6
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